Clock Buffer Delay Tuning for Multi-Core Frequency and Yield

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Solution Overview

Problem

Conventional clock distribution mechanisms in semiconductor processors face challenges in optimizing high-frequency performance while maintaining low-frequency and low-voltage operation, leading to reduced yield and increased power consumption due to minimum delay issues and reprocessing requirements.

Innovation Solution

The implementation of an improved clock distribution mechanism that includes a power management control circuit to dynamically adjust clock delays, enabling or disabling them based on operating conditions, thereby optimizing performance across various frequency and voltage thresholds without reprocessing cores.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Speed

If clock delays are added to compensate for micro-structural manufacturing differences, then high-frequency performance is improved, but low-speed/low-voltage operation becomes unacceptable

Engineering Contradiction:
Improvehigh-frequency performanceVSAvoidlow-speed/low-voltage operation
Core Design Contradiction:
SpeedVSEase of operation

Solution Approach 1:

The patent implements dynamic clock delay adjustment by making the delay mechanism controllable and switchable. The system can enable clock delays when operating at high frequencies to compensate for manufacturing variations, and disable them when operating at low speeds or low voltages. This dynamic adaptation resolves the contradiction by allowing the system to optimize for high-frequency performance only when needed, while maintaining acceptable operation at lower frequencies.

Inventive Principle:
Principle #15Dynamics

2Speed

If distributed clock delays are used to achieve top-end optimization, then processing speed is improved, but core yield is reduced

Engineering Contradiction:
Improveprocessing speedVSAvoidcore yield
Core Design Contradiction:
SpeedVSProductivity

Solution Approach 1:

The patent applies local quality by implementing clock delays selectively rather than universally. Instead of applying fixed delays to all cores regardless of their actual performance characteristics, the system identifies specific cores that benefit from delay compensation and applies delays only to those cores. This selective approach maintains high processing speed for optimized cores while preserving the yield of other cores that do not require delay compensation.

Inventive Principle:
Principle #3Local quality

3Speed

If fixed clock delays are implemented for high-frequency optimization, then maximum frequency is improved, but power consumption increases due to minimum delay issues

Engineering Contradiction:
Improvemaximum frequencyVSAvoidpower consumption
Core Design Contradiction:
SpeedVSUse of energy by moving object

Solution Approach 1:

The system dynamically adjusts clock delays based on operating conditions, enabling delays only when high-frequency operation is required. During low-frequency or low-voltage operation, the delays are disabled, preventing the minimum delay issues that would otherwise force higher voltage operation and increased power consumption. This dynamic control allows the system to achieve maximum frequency when needed while conserving power during normal operation.

Inventive Principle:
Principle #15Dynamics

Data Source

PatentUS10809790B2Dynamic voltage-level clock tuning
Publication Date: 2020.10.20 INTEL CORP
  • US10809790B2 patent drawing
  • US10809790B2 patent drawing
  • US10809790B2 patent drawing

AI summary

Apparatus and methods are provided for improving yield and frequency performance of integrated circuit processors, such as multiple-core processors. In an example, an apparatus can include a plurality of clock buffers, each clock buffer of the plurality of clock buffers configured to receive a first clock signal and distribute a plurality of second clock signals, a one-time programmable locate critical path mechanism configured provide a plurality of indications to enable or disable a delay of each clock buffer of the plurality of clock buffers, and a power management control circuit configured to over-ride one or more of the plurality of indications in a first non-test mode of operation of the apparatus and to not over-ride the one or more indications in a second non-test mode of operation of the apparatus.