Clock Trigger Circuit for Race-Free Low-Voltage Timing
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Solution Overview
Problem
As semiconductor integrated circuits (ICs) become smaller and more complex, they face challenges with decreasing operating voltages, leading to susceptibility to process, voltage, and temperature (PVT) variations, race conditions, and limited immunity to clock slew variations, which affect their performance and reliability.
Innovation Solution
The implementation of a clock circuit with a clock trigger circuit that controls both the latch and trigger circuits using a single clock enable path, providing better immunity to PVT variations and allowing for a larger range of operating voltages, while also incorporating a level shifter circuit for dual-rail memory designs to handle different voltage domains.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If ICs become smaller and more complex to improve integration, then device functionality increases, but susceptibility to PVT variations and race conditions worsens
Solution Approach 1:
The clock circuit is segmented into distinct functional blocks: a latch circuit with first and second latches, a trigger circuit, and a clock trigger circuit. Each segment performs a specific function in the clock generation process, allowing independent optimization and reducing the propagation of PVT variations throughout the entire circuit.
Solution Approach 2:
The latch circuit acts as an intermediary between the clock trigger circuit and the trigger circuit. It receives the clock enable signal from the clock trigger circuit and conditions it before passing to the trigger circuit, thereby isolating the downstream circuitry from upstream variations and improving overall reliability.
2Use of energy by moving object
If operating voltage decreases to improve power efficiency, then energy consumption reduces, but immunity to clock slew variations and susceptibility to race conditions worsens
Solution Approach 1:
The latch circuit is designed with pre-charged nodes and controlled discharge paths that cushion against voltage drops and slew rate variations. The circuit anticipates potential voltage instability at lower operating voltages and incorporates protective mechanisms that maintain proper timing margins even when clock slew rates vary.
Solution Approach 2:
The clock trigger circuit dynamically adjusts its operating parameters including threshold voltages and timing margins to compensate for changes in supply voltage. This allows the circuit to maintain reliable operation across a wide voltage range, effectively decoupling power efficiency improvements from reliability degradation.
3Adaptability or versatility
If multiple clock enable paths are used to improve flexibility, then control capability increases, but susceptibility to race conditions and PVT variations worsens
Solution Approach 1:
Multiple clock enable control functions are merged into a single unified latch circuit that receives the clock enable signal and distributes conditioned versions to both the first and second latches. This consolidation eliminates race conditions that would arise from independent control paths while maintaining full control capability through the centralized latch logic.
Solution Approach 2:
The latch circuit serves multiple functions simultaneously: it acts as a clock enable gate, a signal conditioner, and a timing synchronizer for both downstream latches. This multi-functionality through a single circuit element provides the flexibility of multiple control paths without the reliability penalties of actual parallel paths.
Data Source
AI summary
A clock circuit includes a latch circuit, a memory state latch circuit, a memory state trigger circuit and a clock trigger circuit. The latch circuit is configured to latch an enable signal, and to generate a latch output signal based on a first clock signal. The memory state latch circuit is coupled to the latch circuit, and generates an output clock signal responsive to a first control signal. The memory state trigger circuit is coupled to the memory state latch circuit, and adjusts the output clock signal responsive to the latch output signal or a reset signal. The clock trigger circuit is coupled to the latch circuit and the memory state trigger circuit by a first node, configured to generate the first clock signal responsive to a second clock signal, and configured to control the latch circuit and the memory state trigger circuit based on the first clock signal.