Clone Memory Array Error Detection for Multi-Error Reliability
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Solution Overview
Problem
Existing memory devices, such as RAM and DRAM, face reliability issues due to their inability to effectively detect and correct multi-error bits caused by failures like word line failures or cell-to-cell failures, leading to reduced system reliability.
Innovation Solution
A memory device with a target memory array and a clone memory array, where the clone array stores the same data as the target array, allowing for error detection by comparing data between the two arrays, thereby improving data reliability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If ECC is used to detect and correct error bits, then single error detection capability is improved, but multi-error detection capability deteriorates
Solution Approach 1:
The patent creates a clone memory array that is an exact copy of the target memory array. Both arrays store the same data, and the clone array serves as a backup for error detection. When an error occurs in the target array, the corresponding data in the clone array remains correct, enabling error detection through comparison.
Solution Approach 2:
The patent introduces a comparator as an intermediary component that compares data from the target memory array with corresponding data from the clone memory array. The comparator detects discrepancies between the two arrays, enabling identification of errors in the target array without directly analyzing the error patterns themselves.
2Reliability
If clone memory array is added for error detection, then data reliability is improved, but device complexity increases
Solution Approach 1:
The patent creates a clone memory array that is an exact copy of the target memory array. Both arrays store the same data, and the clone array serves as a backup for error detection. When an error occurs in the target array, the corresponding data in the clone array remains correct, enabling error detection through comparison.
Solution Approach 2:
The clone memory array serves multiple functions: it acts as a backup storage for error detection, provides comparison data for the comparator, and can potentially serve as a redundant storage resource. This multi-functionality justifies the additional hardware investment by providing comprehensive error detection capabilities across the memory system.
Data Source
AI summary
A memory device includes a memory array having at least one memory bank, where the at least one memory bank includes a target memory array and a clone memory array. The clone memory array corresponds to the target memory array and is configured to store the same data as in the target memory array. When a command that is applied to the target memory array to perform an operation, the command is also applied to the clone memory array. An error detection method adapted to a memory device having at least one memory bank that comprises a target memory array and a clone memory array is also introduced.