Clustered Anomaly Detection for Multi-Recipe Semiconductor Tools

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Solution Overview

Problem

Current diagnostic models for semiconductor fabrication processes require significant computing resources and time to create and manage, and struggle with detecting defects in new or under-data recipes, leading to inefficiencies in operation and management.

Innovation Solution

An anomaly detection method using a classifier with an encoder and decoder that learns from training data subsets, extracts features, clusters data, and relearns classifiers to efficiently detect abnormalities in input data, reducing the need for multiple diagnostic models and minimizing computing resources.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If separate diagnostic models are created for each recipe, then detection accuracy for specific recipes is improved, but computing resource consumption and time increase significantly

Engineering Contradiction:
Improvedefect detection accuracyVSAvoidcomputing resource consumption
Core Design Contradiction:
Measurement precisionVSUse of energy by moving object

Solution Approach 1:

The patent creates a single universal diagnostic model that can handle multiple recipes through data clustering and selective relearning. Instead of maintaining separate models for each recipe, the system clusters training data by recipe characteristics and relearns the universal model only when needed, allowing one model to serve multiple functions across different recipes while consuming fewer computing resources

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The system dynamically adjusts the diagnostic model by relearning only when recipe parameters change significantly. By monitoring recipe characteristics and triggering relearning only when necessary, the system maintains high detection accuracy for specific recipes while avoiding continuous full retraining, thus reducing overall computing resource consumption

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If separate diagnostic models are created for each recipe, then detection accuracy for specific recipes is improved, but operation and management complexity increase

Engineering Contradiction:
Improvedefect detection accuracyVSAvoidmodel management complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent creates a single universal diagnostic model that can handle multiple recipes through data clustering and selective relearning. Instead of maintaining separate models for each recipe, the system clusters training data by recipe characteristics and relearns the universal model only when needed, allowing one model to serve multiple functions across different recipes while consuming fewer computing resources

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The system segments the training data by recipe characteristics and uses clustering to organize data into manageable groups. This segmentation allows the universal model to process different recipe types efficiently without requiring separate models, simplifying management while maintaining specialized detection capabilities for each recipe category

Inventive Principle:
Principle #1Segmentation

3Measurement precision

If diagnostic models are relearned whenever recipes change, then detection accuracy is maintained, but time consumption increases

Engineering Contradiction:
Improvedefect detection accuracyVSAvoidmodel relearning time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The system dynamically adjusts the diagnostic model by relearning only when recipe parameters change significantly. By monitoring recipe characteristics and triggering relearning only when necessary, the system maintains high detection accuracy for specific recipes while avoiding continuous full retraining, thus reducing overall computing resource consumption

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The system performs preliminary clustering of training data by recipe characteristics during the learning phase. This preliminary organization allows the model to quickly adapt to new recipes by referencing pre-clustered data patterns, reducing the time required for relearning when recipes change without sacrificing detection accuracy

Inventive Principle:
Principle #10Preliminary action

4Measurement precision

If sufficient training data is accumulated for each recipe, then detection accuracy is improved, but the time to accumulate data increases

Engineering Contradiction:
Improvedefect detection accuracyVSAvoiddata accumulation time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The system dynamically adjusts the diagnostic model by relearning only when recipe parameters change significantly. By monitoring recipe characteristics and triggering relearning only when necessary, the system maintains high detection accuracy for specific recipes while avoiding continuous full retraining, thus reducing overall computing resource consumption

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The system performs preliminary clustering of training data by recipe characteristics during the learning phase. This preliminary organization allows the model to quickly adapt to new recipes by referencing pre-clustered data patterns, reducing the time required for relearning when recipes change without sacrificing detection accuracy

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS20240142936A1Anomaly detection method, electronic device, non-transitory computer-readable storage medium, and computer program
Publication Date: 2024.05.02 SYSTEM ENGINEERING MEGA SOLUTION CO LTD
  • US20240142936A1 patent drawing
  • US20240142936A1 patent drawing
  • US20240142936A1 patent drawing

AI summary

An anomaly detection method capable of minimizing the consumption of computing resources and time is provided. The anomaly detection method includes: learning a first classifier, which includes an encoder and a decoder, using a plurality of training data, which are classified into a plurality of first subsets; extracting features from the plurality of training data by computing the plurality of training data with the encoder of the learned first classifier; reconstructing the plurality of training data into a plurality of second subsets by clustering the plurality of training data based on the extracted features; learning a plurality of second classifiers, which correspond to the plurality of second subsets, using the second subsets; and detecting any abnormality in input data using the plurality of second classifiers.