Coordinate Measuring Machine Correction Matrix Calculation

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Existing coordinate measuring machines require multiple measurements and complex calculations to determine the correction matrix, leading to increased measurement time and difficulty in separating push-in amount and measurement direction effects, especially when using a sinusoidal path.

Innovation Solution

A coordinate measuring machine with a probe and a correction matrix calculation unit that calculates diagonal and non-diagonal components separately using detection values from a calibration reference body, facilitating accurate and efficient calculation of the correction matrix by performing one-point contact measurements and scanning measurements while maintaining a constant relative distance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If scanning measurement is performed twice with different push-in amounts, then the correction matrix can be calculated, but the measurement time increases

Engineering Contradiction:
Improvecorrection matrix calculation accuracyVSAvoidmeasurement time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent segments the correction matrix calculation into two distinct parts: diagonal components calculated from one-point contact measurements, and non-diagonal components calculated from scanning measurements. This segmentation allows each component to be calculated using optimized measurement methods, reducing the total measurement time while maintaining accuracy.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent performs only the necessary one-point contact measurements along the measurement axis rather than full scanning measurements for diagonal components. This partial action approach obtains sufficient data for diagonal components with minimal measurement effort, significantly reducing measurement time compared to performing complete scanning measurements.

Inventive Principle:
Principle #16Partial or excessive action

2Measurement precision

If the tip sphere moves along a sinusoidal path, then the correction matrix can be calculated, but the measurement time increases due to the longer movement path

Engineering Contradiction:
Improvecorrection matrix calculation accuracyVSAvoidmeasurement time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent extracts and isolates the diagonal component calculation from the full scanning measurement process. By separating diagonal components (which require only one-point contact measurements) from non-diagonal components (which require scanning measurements), the method eliminates the need for lengthy sinusoidal path measurements while maintaining calculation accuracy.

Inventive Principle:
Principle #2Taking out (Extraction)

3Measurement precision

If the tip sphere moves along a path parallel to the chord with changing push-in amount, then the correction matrix can be calculated, but it becomes difficult to separate the effect of push-in amount change from measurement direction change

Engineering Contradiction:
Improvecorrection matrix calculation accuracyVSAvoidcalculation complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent segments the correction matrix into diagonal and non-diagonal components, each calculated through distinct measurement methods. Diagonal components are obtained from one-point contact measurements where only the push-in amount varies, while non-diagonal components are obtained from scanning measurements. This segmentation cleanly separates the effects of push-in amount changes from measurement direction changes, simplifying the calculation process.

Inventive Principle:
Principle #1Segmentation

4Productivity

If diagonal and non-diagonal components are calculated separately using different measurement methods, then the correction matrix calculation is simplified and calculation time is reduced

Engineering Contradiction:
Improvecalculation speedVSAvoidmeasurement process complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The patent divides the correction matrix calculation into two independent segments: diagonal components from one-point contact measurements and non-diagonal components from scanning measurements. This segmentation allows each segment to be processed independently with optimized algorithms, improving calculation speed while the modular structure keeps the overall process manageable.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces an intermediary classification system that categorizes measurement data into diagonal and non-diagonal components. This intermediary classification simplifies the subsequent calculation process by organizing data in a way that naturally separates the two types of corrections, making the overall process more efficient despite the increased measurement steps.

Inventive Principle:
Principle #24Intermediary (Mediator)

Data Source

PatentUS9746303B2Coordinate measuring machine and method for calculating correction matrix by coordinate measuring machine
Publication Date: 2017.08.29 MITUTOYO CORP
  • US9746303B2 patent drawing
  • US9746303B2 patent drawing
  • US9746303B2 patent drawing

AI summary

A first correction component calculation processing unit calculates diagonal components of a correction matrix based on first and second detection values. The first and second detection values are obtained by measurement in which a calibration reference body and the probe are moved relatively to each other in a normal direction on a surface of the calibration reference body so as to bring a measurement tip into contact with the surface of the calibration reference body at one point. A second correction component calculation processing unit calculates non-diagonal components of the correction matrix based on third and fourth detection values. The third and fourth detection values are obtained by scanning measurement using the measurement tip on the surface of the calibration reference body while maintaining a constant relative distance between the center of the measurement tip and a reference point or a reference line of the calibration reference body.