CMOS Ionizing Dose Measurement Using Differential Acquisition Circuits
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Solution Overview
Problem
Conventional devices for measuring ionizing particles in electronic circuits are limited by compatibility with CMOS technology, complexity, silicon real estate, sensitivity to temperature and voltage variations, and imprecise quantitative measurements, especially in environments exposed to alpha/beta particles, X/gamma rays, or neutrons.
Innovation Solution
A device comprising acquiring circuit stages with different sensitivities generating variable acquisition signals, a processing circuit to compute a relative parameter using a polynomial relationship, and a computing circuit to calculate the total ionizing dose, compatible with CMOS technology and requiring minimal silicon space, without additional modules or clock signals.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional measuring devices are used to detect ionizing particles, then measurement capability is provided, but device complexity increases and CMOS compatibility is lost
Solution Approach 1:
The patent merges the ionizing particle measurement function with existing CMOS circuit structures by integrating ring oscillators and logic circuits that are natively compatible with CMOS technology. The measurement capability is combined with standard digital logic blocks (AND gates, inverters, counters) rather than using separate dedicated measuring modules, thereby eliminating the complexity and incompatibility issues of conventional approaches.
Solution Approach 2:
The patent creates a universal measuring device that can detect multiple types of ionizing particles (alpha, beta, X-rays, gamma rays, protons, neutrons) using a single CMOS-compatible circuit architecture. The ring oscillator-based sensing mechanism provides multi-functionality across different radiation types while maintaining compatibility with standard CMOS fabrication processes.
2Measurement precision
If additional measuring modules are added to detect ionizing particles, then measurement function is provided, but silicon real estate increases
Solution Approach 1:
The measurement function is merged into existing CMOS circuit blocks, using ring oscillators and logic gates that are standard components in digital integrated circuits. By combining the measurement capability with existing circuit elements rather than adding separate dedicated modules, the patent minimizes the additional silicon area required while maintaining full measurement functionality.
3Measurement precision
If conventional measuring devices are used, then ionizing particle detection is provided, but sensitivity to temperature and voltage variations increases
Solution Approach 1:
The patent employs feedback mechanisms through the ring oscillator circuits and logic gate configurations that inherently compensate for temperature and voltage variations. The oscillation frequency and logic circuit behavior serve as self-referencing indicators that allow the system to distinguish between radiation-induced changes and environmental variations, thereby reducing sensitivity to harmful factors like temperature and voltage fluctuations.
4Device complexity
If simple measurement methods are used, then device complexity is reduced, but measurement accuracy decreases
Solution Approach 1:
The patent replaces complex mechanical or dedicated electronic measuring mechanisms with a simplified CMOS-based ring oscillator and logic circuit system. By substituting traditional measuring hardware with semiconductor-based oscillation and logic operations, the patent achieves both reduced device complexity and maintained measurement accuracy through the inherent properties of CMOS circuits and digital signal processing.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate and simple measurement of ionizing particles and total ionizing dose with improved sensitivity and reduced temperature and voltage variations, while being fully compatible with CMOS technologies and not requiring additional modules or clock signals.
Implementation Method 1
when an electronic circuit is exposed to ionizing particle radiation, such as alpha/beta particles, X/gamma rays, protons or neutrons, the accumulation of the electrical charge deposited by these ionizing particles may significantly modify intrinsic technical properties of the irradiated electronic circuit
Data Source
AI summary
Absorbed ionizing particles differentially effect first and second acquiring circuit stages configured to respectively generate first and second acquisition signals. Each acquisition signal has a characteristic that is variable as a function of an amount of absorbed ionizing particles. A measuring circuit generates, on the basis of the first and second acquisition signals, a relative parameter indicative of a relationship between the variable characteristics. A computation of a total ionizing dose is made using a 1st- or 2nd-degree polynomial relationship in the relative parameter.