CMOS Image Sensor CCD Signal Compatibility Circuit
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Solution Overview
Problem
There is no CMOS image sensor that is compatible with the electrical signals of CCD image sensors, limiting the ability to replace CCD sensors in applications where their performance is optimized without incurring high costs.
Innovation Solution
A CMOS image sensor with a control signal conversion circuit, row selection circuit, and column selection circuit that converts CCD control signals into compatible signals for a CMOS photosensitive array, allowing it to operate as a compatible substitute for CCD image sensors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If a CMOS image sensor is used to replace a CCD image sensor, then cost is reduced and integration is improved, but compatibility with existing CCD control signals is lost
Solution Approach 1:
The patent introduces a control signal conversion circuit as an intermediary component between the CMOS image sensor and the external control system. This circuit receives CCD-compatible control signals (vertical transfer signal, horizontal transfer signal, electronic shutter signal, readout clock signal) and converts them into the appropriate control signals for the CMOS sensor, thereby enabling compatibility without changing the external interface or requiring system redesign
Solution Approach 2:
The control signal conversion circuit performs parameter transformation on the control signals, changing their timing characteristics, pulse widths, and sequences to match the requirements of the CMOS sensor while maintaining compatibility with the original CCD control signal interface
2Adaptability or versatility
If a control signal conversion circuit is added to enable CCD compatibility, then adaptability is improved, but device complexity increases
Solution Approach 1:
The control signal conversion circuit is integrated within the image sensor device itself, merging the conversion function with the sensor's existing control circuitry. This approach consolidates multiple functions (signal reception, conversion, and sensor control) into a single unified structure, reducing overall system complexity compared to using separate external conversion devices
3Adaptability or versatility
If CCD image sensors are used to maintain signal compatibility, then adaptability is preserved, but manufacturing cost increases
Solution Approach 1:
The patent employs a CMOS image sensor, which is inherently less expensive to manufacture than a CCD sensor, as the base device. By adding a relatively simple control signal conversion circuit, the system achieves CCD compatibility at a lower overall cost than using an expensive CCD sensor directly
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables the CMOS image sensor to be used in CCD image processing systems, reducing costs and improving practicality while maintaining the advantages of CCD sensors, such as sensitivity, by providing a flexible and compatible solution.
Implementation Method 1
the CMOS image sensors convert photo induced charges at each pixel into a voltage signal
Data Source
AI summary
An image sensor and an image processing system. The image sensor comprises: a CMOS photosensitive array used for converting an optical signal into an electrical signal; a control signal conversion circuit used for converting into a second control signal a first control signal for driving a CCD photosensitive array to operate, the first control signal at least comprising a vertical transfer signal, a horizontal transfer signal, an electronic shutter signal and a read-out clock signal, and the second control signal at least comprising a column address signal, a row reset control signal and a row read-out control signal; a row selection circuit used for generating a row reset signal according to the row reset control signal and generating a row read-out signal according to the row read-out control signal; and a column selection circuit used for conducting column gating on the CMOS photosensitive array under the control of the column address signal and outputting a column read-out signal. The technical solution of the present invention achieves the compatibility substitution of a CCD image sensor and a CMOS image sensor.