CMOS Imager Flicker Detection and Power Management
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Solution Overview
Problem
Existing imaging devices for mobile devices face issues with flicker detection and correction, especially in changing environments, and have limited power efficiency, making them incompatible with mobile devices. Additionally, testing these devices is costly and inefficient, as it is holistic and cannot identify sub-component failures effectively.
Innovation Solution
The development of an imaging device with a CMOS sensor, integrated image processing algorithms, and advanced features like flicker detection and correction, power management, and a built-in self-test capability, which includes a pixel array, analog to digital converter, and programmable core for advanced testing and power reduction.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If manual selection between integration times is provided to reduce flicker, then flicker is reduced in pre-determined environments, but user adjustment is required and it cannot address various flicker situations in changing environments
Solution Approach 1:
The imaging device automatically detects flicker frequency and adjusts integration time without user intervention. The processor monitors the captured images for flicker patterns, identifies the flicker frequency, and dynamically modifies the integration time parameter to eliminate flicker, making the system self-adjusting to different lighting environments.
Solution Approach 2:
The integration time is made dynamic rather than static, allowing real-time adjustment based on detected flicker conditions. The system continuously adapts the integration time parameter in response to changing lighting environments and detected flicker frequencies, transitioning from fixed pre-determined values to adaptive dynamic control.
2Use of energy by moving object
If approaches are taken to increase the amount of power available to mobile devices, then power requirements of imaging applications are met, but cost increases and device dimensions increase
Solution Approach 1:
The imaging device operates in periodic cycles, alternating between active imaging mode and low-power standby mode. The processor activates the imaging sensor and processing circuits only when imaging is required, then enters a low-power state, thereby reducing overall power consumption while maintaining imaging functionality when needed.
Solution Approach 2:
The system discards continuous power consumption by implementing sleep modes where non-essential circuits are powered down. Power is recovered and allocated dynamically only when imaging operations are required, optimizing the balance between power availability and consumption for mobile device constraints.
3Reliability
If holistic testing of imaging device is performed, then overall device functionality is tested, but ability to identify sub-component failures is limited and testing is costly and time consuming
Solution Approach 1:
The testing process is segmented into hierarchical levels: sub-component level testing for individual pixels and circuit elements, module level testing for functional blocks, and system level holistic testing. This segmentation allows efficient identification of specific failed sub-components while maintaining overall device functionality assessment, reducing testing time and cost compared to purely holistic approaches.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution provides effective flicker detection and correction, reduces power consumption, and enables advanced testing capabilities, enhancing the functionality and efficiency of imaging devices for mobile devices.
Implementation Method 1
a light sensitive element, such as a photodiode
Data Source
AI summary
Systems, methods and devices related to detecting and transmitting images. Imaging system and devices, as well as methods of using such that are provided herein include flicker detection and/or correction; and/or built-in self test associated with various analog circuitry in the imaging devices; and/or power reduction ability; and/or pixels with charge evacuation functionality; and/or parallel to serial conversion unit and associated serial output interface; and/or other advanced functionality.