CMOS TDI Sensor Zero Desynchronization via Segmented Integration

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Solution Overview

Problem

Conventional CMOS image sensors lack the mechanism to perform time-delayed integration (TDI) imaging due to the absence of a mechanism for adding multiple samples of a ground pixel as it traverses the imaging array, leading to low signal-to-noise ratio (SNR) and spatial desynchronization issues.

Innovation Solution

The implementation of a CMOS TDI sensor with zero desynchronization, where the integration time is reduced to allow for additional time for pixel reset and data transfer operations, maintaining synchronization by increasing the pixel data rate and adding extra TDI stages to ensure synchronous addition of samples, thereby maintaining the signal-to-noise ratio.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If the integration time is increased to improve signal-to-noise ratio, then the signal level increases, but the pixel reset and data transfer operations cannot be completed in time, causing spatial desynchronization

Engineering Contradiction:
Improvesignal-to-noise ratioVSAvoidspatial desynchronization
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The imaging array is divided into multiple TDI stages (first TDI stage, second TDI stage, etc.), each handling a portion of the integration process. This segmentation allows the system to process multiple samples sequentially while maintaining synchronization, enabling longer effective integration times without losing spatial alignment.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces a temporal dimension to the imaging process by implementing multiple TDI stages that process samples at different time points. This transforms the traditional single-exposure spatial imaging into a multi-temporal integration process, where samples taken at different times are combined across multiple stages to achieve both high SNR and spatial synchronization.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Reliability

If conventional CMOS readout is used with sequential row-by-row sampling, then device complexity is low, but multiple samples of the same ground pixel cannot be added, resulting in low signal-to-noise ratio

Engineering Contradiction:
Improvesignal-to-noise ratioVSAvoidTDI stage structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

Each TDI stage is designed with multi-functionality, serving both as a sample acquisition unit and an addition unit. The same hardware structure (photosensitive elements, switches, and addition circuits) is replicated across multiple stages, allowing the system to achieve TDI functionality without requiring fundamentally different components, thus controlling complexity while enabling multiple sample integration.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent implements multiple copies of the TDI stage structure (first TDI stage, second TDI stage, etc.), where each stage is a replicated version of the basic TDI unit. This copying approach allows the system to accumulate multiple samples by simply adding more identical stages, making the complexity increase linear and predictable rather than exponentially.

Inventive Principle:
Principle #26Copying

3Duration of action of moving object

If the pixel data rate is increased to allow more samples per ground pixel, then integration periods increase, but the readout speed must increase accordingly, affecting device operation

Engineering Contradiction:
Improveintegration periodsVSAvoidpixel data rate
Core Design Contradiction:
Duration of action of moving objectVSSpeed

Solution Approach 1:

The high data rate requirement is segmented across multiple TDI stages, each operating at a manageable data rate. Instead of requiring one stage to process all samples at high speed, the total integration is distributed across multiple stages that each handle a portion of the samples, reducing the instantaneous data rate burden on any single component.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The TDI stages operate continuously to accumulate samples, with each stage constantly receiving and processing incoming pixel data. This continuous operation allows the system to maintain high effective integration times without requiring periodic high-speed bursts, smoothing out the data rate requirements and enabling sustained long-duration integration.

Inventive Principle:
Principle #20Continuity of useful action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enhances the signal-to-noise ratio and maintains spatial frequency resolution without degrading the modulation transfer function, allowing for efficient TDI imaging with increased integration periods per ground scene pixel.

Implementation Method 1

Solid-state image sensors use an array of picture elements (pixels), typically arranged in rows and columns, to convert electromagnetic (EM) energy (e.g., infrared, visible light, ultraviolet light, x-rays, etc) into a charge that can be detected and processed to generate a digital image.

Methodology Applied
Scientific EffectPhotoelectric effect: Photoelectric Effect

Data Source

PatentUS7675561B2Time delayed integration CMOS image sensor with zero desynchronization
Publication Date: 2010.03.09 SEMICON COMPONENTS IND LLC
  • US7675561B2 patent drawing
  • US7675561B2 patent drawing
  • US7675561B2 patent drawing

AI summary

A time delayed integration image sensor provides over-sampled image data on a time-shared column bus to maintain data synchronization.