CMOS-TFT Semiconductor Structure With Leveled Capping Layers

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Solution Overview

Problem

Integrating high-power, high-frequency, and high-speed thin-film transistors (TFT) devices into traditional CMOS logic processes is challenging due to complexity and cost, with a need to simplify the overall process and reduce manufacturing costs while controlling thermal budgets.

Innovation Solution

The integration of high-voltage TFT devices into the front-end-of-line (FEOL) of CMOS logic processes, where active areas for TFT devices are defined before CMOS logic device formation, using a substrate with a TFT channel layer, MOSFET, and interlayer dielectric layers functioning as a gate dielectric, and forming TFT and MOSFET components in a sequential manner to reduce process steps and costs.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If TFT devices are integrated into traditional CMOS logic process, then device performance and functionality are improved, but process complexity and manufacturing cost increase

Engineering Contradiction:
Improvedevice performanceVSAvoidprocess complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent merges TFT and CMOS process flows into a unified integrated process. The TFT active area definition, channel layer formation, and gate electrode creation are combined with CMOS well formation and transistor fabrication steps, allowing both device types to be manufactured simultaneously on the same substrate through a single integrated process sequence.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent creates a universal process platform that can manufacture both TFT devices and CMOS logic devices using the same sequence of process steps. The integrated FEOL process serves multiple functions: defining TFT active areas, forming TFT channel layers, creating CMOS wells, and fabricating CMOS transistors, all within a single multi-functional manufacturing flow.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Adaptability or versatility

If TFT devices are integrated into CMOS process, then overall functionality is improved, but manufacturing cost increases

Engineering Contradiction:
Improveoverall functionalityVSAvoidmanufacturing cost
Core Design Contradiction:
Adaptability or versatilityVSEase of manufacture

Solution Approach 1:

The patent combines TFT and CMOS manufacturing into a single integrated process, eliminating the need for separate production lines. By merging the process flows, the patent achieves economies of scale, reduces equipment and facility requirements, and lowers overall manufacturing costs while maintaining the ability to produce both device types with high functionality.

Inventive Principle:
Principle #5Merging (Combining)

3Device complexity

If TFT active areas are defined after CMOS well formation, then process sequencing is simplified, but thermal budget control deteriorates

Engineering Contradiction:
Improveprocess sequencingVSAvoidthermal budget control
Core Design Contradiction:
Device complexityVSTemperature

Solution Approach 1:

The patent performs preliminary action by defining TFT active areas and forming TFT channel layers before CMOS well formation and transistor fabrication. This sequencing allows the TFT structures to be established early in the process when thermal conditions are more controlled, enabling better thermal budget management while maintaining straightforward process sequencing through careful step-by-step execution.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS12057313B2Semiconductor structure and method of manufacturing the same
Publication Date: 2024.08.06 UNITED MICROELECTRONICS CORP
  • US12057313B2 patent drawing
  • US12057313B2 patent drawing
  • US12057313B2 patent drawing

AI summary

The present invention provides a semiconductor structure, including a substrate, a thin-film transistor (TFT) on the substrate, wherein the thin-film transistor including a TFT channel layer, a first source and a first drain in the TFT channel layer and a first capping layer on the TFT channel layer. A MOSFET is on the substrate, with a second gate, a second source and a second drain on two sides of the second gate and a second capping layer on the second gate, wherein top surfaces of the second capping layer and the first capping layer are leveled, and a first ILD layer is on the first capping layer and the second capping layer, wherein the first ILD layer and the first capping layer function collectively as a gate dielectric layer for the TFT.