CMOS Transistor Rail Network for Gaussian Voltage Sampling
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Solution Overview
Problem
Current CMOS-based integrated circuits face challenges in accurately measuring voltage fluctuations due to small capacitances relative to thermal noise, leading to impracticality in capturing high-precision Gaussian distributions, and existing amplification methods introduce additional noise, limiting the effectiveness of voltage measurement.
Innovation Solution
The implementation of CMOS circuits with transistor rails and tunable effective temperatures, where each transistor rail is connected by capacitors to form a network that mimics RC circuits, allowing for controlled voltage fluctuations that follow Gaussian distributions, using nMOS and pMOS transistors to manage voltage differences and apply specific voltage sets.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If CMOS circuits with small capacitances are used to measure voltage fluctuations, then the circuit design is compact and mass-producible, but the measurement precision deteriorates due to thermal noise dominance
Solution Approach 1:
The patent introduces an intermediary measurement system that couples to the CMOS circuit nodes without directly measuring the small capacitances. By using a separate measurement apparatus with its own larger capacitance elements, the system mediates the measurement process to avoid thermal noise dominance while preserving the compact CMOS design
Solution Approach 2:
The patent replaces direct electrical measurement of small capacitances with an alternative measurement approach that uses coupled oscillating systems. The measurement system uses its own resonant characteristics to indirectly detect voltage fluctuations, substituting direct capacitance measurement with a different physical measurement paradigm that is less susceptible to thermal noise
2Measurement precision
If amplification methods are used to enhance voltage measurement, then the measurement sensitivity is improved, but additional noise is introduced that limits effectiveness
Solution Approach 1:
The measurement system acts as an intermediary that couples to the circuit nodes through controlled interactions rather than direct amplification. This intermediary approach allows sensitive detection without requiring high-gain amplifiers that would introduce additional noise
Solution Approach 2:
The measurement system is designed to perform multiple functions: it can detect voltage fluctuations, characterize circuit behavior, and operate with different CMOS circuit configurations. This multi-functionality reduces the need for specialized high-gain amplification circuits, thereby minimizing noise introduction
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables faster and more energy-efficient generation of samples from Gaussian distributions, accurately reflecting physical phenomena with reduced energy consumption compared to software methods, while maintaining the shape of the distribution.
Implementation Method 1
a first capacitor connected to the first node and the second node
Implementation Method 2
a first transistor comprising a first terminal, a second terminal, and a third terminal, wherein the first terminal is connected to a first node and the second terminal is connected to a second node
Implementation Method 3
a voltage source is configured to apply a first voltage, V1, to the fifth terminal
Data Source
Figure 1A
Figure 1B
Figure 2
AI summary
An apparatus (300) comprises: one or more voltage sources; a plurality of transistor rails (301A-301C), each transistor rail of the plurality of transistor rails comprising a first transistor (302A-302C) connected to a first node (321A-312C) and a second node (314A-314C), a second transistor (304A-304C) connected to the first node, and a first capacitor (C1-C3) connected to the first node and the second node; wherein the first node of each transistor rail of the plurality of transistor rails is connected to a first node of two different respective transistor rails of the plurality of transistor rails by two different respective capacitors (C12, C13); wherein one or more voltage sources are configured to apply a respective set of voltages to each transistor rail of the plurality of transistor rails.