Y-Shaped Cleaning Nozzle for CMP Pad Residue Removal

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Solution Overview

Problem

Existing chemical mechanical polishing (CMP) processes face inefficiencies due to residue accumulation on polishing pads, which reduces their surface roughness and polishing efficiency, and current cleaning nozzles in polishing machines are insufficient to effectively remove these residues without prolonging processing time.

Innovation Solution

The cleaning nozzle is redesigned with a Y-shaped structure incorporating a water inlet, a water outlet, and an air inlet, allowing for the introduction of pressurized gas to enhance the water pressure and cleaning efficiency by mixing gas with the cleaning liquid, which is sprayed onto the polishing pad to dislodge residues.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a traditional cleaning nozzle is used to clean the polishing pad, then the cleaning process can be performed, but the cleaning performance is insufficient and residues remain on the polishing pad

Engineering Contradiction:
Improvecleaning performanceVSAvoidpolishing efficiency
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent applies pneumatic principles by introducing a gas inlet that delivers pressurized gas into the cleaning liquid flow path. The gas injection creates turbulent flow and increases the kinetic energy of the cleaning liquid, enabling it to effectively remove residues from the polishing pad surface that traditional liquid-only nozzles cannot eliminate.

Inventive Principle:
Principle #29Pneumatics and hydraulics

Solution Approach 2:

The patent merges two cleaning mechanisms into a single nozzle system: liquid cleaning (water flow) and gas cleaning (pressurized gas flow). The Y-shaped internal structure allows both liquid and gas to converge and exit together, creating a combined cleaning jet that leverages the advantages of both phases for superior residue removal.

Inventive Principle:
Principle #5Merging (Combining)

2Reliability

If the cleaning nozzle is improved to enhance cleaning performance, then residues can be effectively removed, but the device complexity increases

Engineering Contradiction:
Improvecleaning performanceVSAvoidnozzle structure complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The nozzle is segmented into distinct functional zones: a liquid inlet channel, a gas inlet channel, and a convergence chamber where the two flows interact. The Y-shaped internal structure clearly separates the liquid and gas pathways before they merge, allowing independent control and optimization of each flow while maintaining a relatively simple overall geometry.

Inventive Principle:
Principle #1Segmentation

3Productivity

If pressurized gas is introduced to enhance water pressure, then cleaning efficiency improves, but energy consumption increases

Engineering Contradiction:
Improvecleaning efficiencyVSAvoidenergy consumption
Core Design Contradiction:
ProductivityVSUse of energy by moving object

Solution Approach 1:

The cleaning liquid acts as an intermediary that transfers and amplifies the energy from the pressurized gas to the residue particles. The gas injects energy into the liquid flow, and the liquid flow subsequently delivers this enhanced energy to the cleaning target, providing indirect but effective energy transfer that improves cleaning efficiency.

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The enhanced cleaning process effectively reduces residue levels on the polishing pad, improving polishing efficiency and extending its service life by maintaining a cleaner surface, with residue reduction from 2% to below 0.5% on average.

Implementation Method 1

a pressurized gas flows in from the air inlet to strengthen the pressure of the cleaning liquid sprayed from the water outlet

Methodology Applied
Scientific EffectGas pressure enhancement: Pressure Increase

Data Source

PatentUS12427548B2Cleaning process of wafer polishing pad and cleaning nozzle
Publication Date: 2025.09.30 UNITED SEMICONDUCTOR (XIAMEN) CO LTD
  • US12427548B2 patent drawing
  • US12427548B2 patent drawing

AI summary

A cleaning process of wafer polishing pad, the process includes providing a wafer polishing pad, performing a planarization process with the wafer polishing pad, leaving a residue on the wafer polishing pad after the planarization process, and performing a cleaning step with a cleaning nozzle to remove the residue, the cleaning nozzle comprises at least one Y-shaped pipe, one end of which is a water outlet, and the other two ends are respectively a water inlet and an air inlet, wherein a cleaning liquid flows from the water inlet to the water outlet, and a pressurized gas flows in from the air inlet.