High-Porosity CMP Pad Formulation for Hardness-Defectivity Balance
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Solution Overview
Problem
Current CMP polishing pads face a performance tradeoff between removal rate and defectivity, with increased hardness leading to more defects and reduced layer uniformity in semiconductor, optical, or magnetic substrates.
Innovation Solution
A two-component polyurethane composition with a liquid aromatic isocyanate component and a liquid polyol component, including water or CO2-amine adduct, is used to create CMP polishing pads with a Shore DO hardness of 40 or more and specific gravity of 0.5 or less, optimizing hardness and removal rate while minimizing defectivity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If the hardness of CMP polishing pads is increased to improve removal rate, then removal rate is improved, but defectivity increases and layer uniformity deteriorates
Solution Approach 1:
The patent applies porous materials by incorporating a porogen (such as hollow glass beads or porous particles) into the polyurethane composition during foam formation. This creates a controlled porous structure within the polishing pad that reduces its effective hardness and density while maintaining the underlying polymeric hardness. The porosity allows the pad to be more compliant and less likely to generate defects, thereby resolving the contradiction between removal rate and defectivity by enabling a softer operating surface from a harder base material.
Solution Approach 2:
The patent employs composite materials by combining polyurethane polymer matrix with porogen particles (hollow glass beads, porous silica, or other porous fillers) to create a multi-phase composite structure. This composite approach allows the pad to exhibit tailored mechanical properties where the polyurethane provides structural integrity and the porogen creates void spaces that reduce hardness and improve compliance. The composite structure enables simultaneous achievement of high removal rate and low defectivity.
2Object-affected harmful factors
If the density of CMP polishing pads is decreased to reduce defectivity, then defectivity is reduced, but removal rate decreases
Solution Approach 1:
The patent utilizes porous materials by incorporating porogens that create controlled void spaces within the polishing pad matrix. This porous structure reduces the effective density and hardness of the pad, making it more compliant and less defect-generating during polishing. The porosity is optimized to balance compliance (reducing defects) with sufficient structural support (maintaining removal rate).
Solution Approach 2:
The patent applies parameter changes by carefully controlling the amount, size distribution, and morphology of porogen particles incorporated into the polyurethane foam. By adjusting porogen content (typically 10-50 wt%), particle size (1-100 micrometers), and foam cell structure, the patent optimizes the balance between pad density, hardness, and compliance to simultaneously achieve low defectivity and high removal rate.
3Object-affected harmful factors
If the porosity of CMP polishing pads is increased to improve compliance and reduce defects, then defectivity is reduced, but mechanical strength decreases
Solution Approach 1:
The patent employs composite materials by creating a hybrid structure where a polyurethane polymer matrix provides mechanical strength and structural integrity, while embedded porogen particles (hollow glass beads, porous silica, etc.) create compliant porous regions. This composite architecture allows the pad to maintain sufficient tensile and compressive strength from the continuous polymer phase while the porous regions provide compliance and defect reduction. The interfacial bonding between porogen and matrix is optimized to prevent premature failure.
Solution Approach 2:
The patent applies local quality by creating spatially differentiated properties within the polishing pad: the polyurethane matrix regions provide mechanical strength and structural support, while the porous regions surrounding porogen particles provide compliance and defect reduction. This local differentiation of material properties allows simultaneous achievement of high strength and low defectivity in different zones of the same material structure.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The resulting CMP polishing pads exhibit improved hardness and removal rate performance with reduced defectivity, achieving a balance previously unattainable in CMP production methods, with porosity and tensile modulus contributing to enhanced planarization efficiency and low defect formation.
Implementation Method 1
The liquid polyol component contains water in the amount of from 1000 to 8500 ppm, based on the total weight of the two-component reaction mixture
Implementation Method 2
CMP polishing pads comprising the polyurethane foam reaction product of a two-component reaction mixture
Data Source
AI summary
The present invention provides CMP polishing pads or layers having a Shore DO (15 second) hardness of from 40 to 80 made from a two-component reaction mixture of (i) a liquid aromatic isocyanate component comprising one or more aromatic diisocyanates or a linear aromatic isocyanate-terminated urethane prepolymer, and (ii) a liquid polyol component comprising a) one or more polymeric polyols, b) from 15 to 36 wt. %, based on the total weight of the liquid polyol component, of one or more small chain difunctional polyols having from 2 to 6 carbon atoms, c) from 0 to 25 wt. %, based on the total weight of the liquid polyol component, of a liquid aromatic diamine which is a liquid at standard pressure and at 40° C., and d) an amount of water or CO2-amine adduct sufficient to reduce the density of a CMP polishing pad made from the two-component reaction mixture to from 0.2 to 0.50 g/mL, wherein the reaction mixture comprises 60 to 75 wt. % of hard segment materials, based on the total weight of the reaction mixture.