CMP Polishing Pad with Buried Compressibility Stripe

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Solution Overview

Problem

Existing polishing pads for Chemical Mechanical Polishing (CMP) struggle to balance rigidity and compressibility, which affects the flatness and uniformity of semiconductor wafers, leading to increased processing time and reduced productivity.

Innovation Solution

A polishing pad with a compressibility-aiding stripe buried within the pad body, where the compressibility of the stripe is greater than the pad body, enhancing the pad's overall compressibility and rigidity, achieved through a fabricating method involving a mold and polymer material, with the stripe arranged in various configurations such as parallel, radial, or spiral to optimize wafer flatness and uniformity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Strength

If a high-rigidity polishing pad is used, then wafer flatness is improved, but wafer uniformity deteriorates

Engineering Contradiction:
ImproverigidityVSAvoidwafer uniformity
Core Design Contradiction:
StrengthVSManufacturing precision

Solution Approach 1:

The polishing pad incorporates regions of different rigidity: a high-rigidity base layer for overall flatness support, and localized low-rigidity regions (compressibility-aiding stripes) for uniformity enhancement. This spatial variation in material properties allows simultaneous achievement of both wafer flatness and uniformity

Inventive Principle:
Principle #3Local quality

2Manufacturing precision

If a high-compressibility polishing pad is used, then wafer uniformity is improved, but wafer flatness deteriorates

Engineering Contradiction:
Improvewafer uniformityVSAvoidrigidity
Core Design Contradiction:
Manufacturing precisionVSStrength

Solution Approach 1:

The polishing pad structure includes a high-rigidity base layer that maintains overall flatness, with localized high-compressibility regions (compressibility-aiding stripes) embedded within. These localized soft regions provide the necessary compressibility for uniformity without compromising the global structural rigidity

Inventive Principle:
Principle #3Local quality

3Manufacturing precision

If separate high-rigidity and high-compressibility polishing pads are used sequentially, then both flatness and uniformity are improved, but processing time increases

Engineering Contradiction:
Improvewafer flatness and uniformityVSAvoidprocessing time
Core Design Contradiction:
Manufacturing precisionVSLoss of time

Solution Approach 1:

The invention merges the functions of separate high-rigidity and high-compressibility polishing pads into a single integrated structure. The multi-layer construction with different rigidity regions allows both flatness and uniformity to be achieved in one polishing operation, eliminating the need for sequential pad changes

Inventive Principle:
Principle #5Merging (Combining)

Data Source

PatentUS8480773B2Method of fabricating a polishing pad
Publication Date: 2013.07.09 IV TECH CO LTD
  • US8480773B2 patent drawing
  • US8480773B2 patent drawing
  • US8480773B2 patent drawing

AI summary

A polishing pad having a compressibility-aiding stripe buried therein is fabricated by assembling the compressibility-aiding stripe in a mold cavity, filling the mold cavity with a polymer material, and releasing the polishing pad from the mold. Embodiments include assembling a compressibility-aiding stripe comprising a solid pillar of material having a larger compressibility than that of the polishing pad body, and releasing a single layer polishing pad from the mold.