CMP Polyurethane Film Composition for Stable Zeta Potential

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Solution Overview

Problem

Existing polyurethane films used in chemical mechanical planarization (CMP) polishing applications face challenges with non-uniform polishing performance due to variations in thickness and zeta potential, which are influenced by the migration and diffusion of additives, leading to inconsistent polishing results and reduced removal rates.

Innovation Solution

A polyurethane composition is developed with multifunctional amines covalently bonded into the backbone, stabilizing zeta potential and preventing additive migration, using a reactive mixture with a mole ratio of isocyanate groups to hydroxyl groups of 0.98 or greater, ensuring uniform thickness and enhanced polishing performance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional polyurethane films are used in CMP polishing applications, then the polishing process can be performed, but non-uniform polishing performance occurs due to variations in thickness and zeta potential caused by additive migration and diffusion

Engineering Contradiction:
Improvepolishing performance uniformityVSAvoidadditive stability
Core Design Contradiction:
ReliabilityVSStability of the object's composition

Solution Approach 1:

The patent removes problematic small molecule additives from the polyurethane composition. Instead of using separate additives that migrate and diffuse, the desired functionalities (zeta potential control, thickness uniformity) are achieved through the polyurethane backbone structure itself and the controlled reaction stoichiometry, eliminating the source of non-uniformity.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent creates a composite polyurethane system by combining multiple components (polyol, diol chain extender, diisocyanate, mono-alcohol, multifunctional amine) in specific ratios. This composite approach allows the system to achieve both mechanical properties and electrostatic properties (zeta potential) through the integrated molecular structure rather than separate additives.

Inventive Principle:
Principle #40Composite materials

2Productivity

If polyurethane films with additives are used to achieve desired zeta potential and thickness, then polishing can proceed, but the additives migrate and diffuse causing inconsistent polishing results and reduced removal rates

Engineering Contradiction:
Improveremoval rateVSAvoidpolishing consistency
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent establishes the correct isocyanate-to-hydroxyl ratio (0.98 or greater) before film formation and polishing operation. This preliminary stoichiometric control ensures that the zeta potential and thickness are uniform from the start, preventing the need for corrective actions during polishing and maintaining consistent removal rates throughout the pad's service life.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent changes the critical parameter of isocyanate-to-hydroxyl mole ratio to 0.98 or greater. This specific parameter change fundamentally alters the polyurethane film properties, resulting in stable zeta potential and uniform thickness that maintain consistent polishing performance and high removal rates without additive migration issues.

Inventive Principle:
Principle #35Parameter changes

3Manufacturing precision

If conventional polyurethane synthesis is used, then film fabrication is achieved, but variations in thickness and zeta potential lead to non-uniform polishing performance

Engineering Contradiction:
Improvefilm thickness uniformityVSAvoidpolishing performance
Core Design Contradiction:
Manufacturing precisionVSReliability

Solution Approach 1:

The patent precisely controls the isocyanate-to-hydroxyl mole ratio parameter at 0.98 or greater during synthesis. This precise parameter control ensures uniform polymerization throughout the film, resulting in consistent thickness and stable zeta potential that translate to reliable, uniform polishing performance across the entire polishing pad surface.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution provides a polyurethane film with stable zeta potential and uniform thickness, improving polishing consistency and increasing removal rates by attracting abrasive particles, thus enhancing CMP process efficiency.

Implementation Method 1

multifunctional amines covalently bonded into the backbone, stabilizing zeta potential and preventing additive migration

Methodology Applied
Scientific EffectCovalent bonding: Chemical Bonding

Implementation Method 2

improving polishing consistency and increasing removal rates by attracting abrasive particles

Methodology Applied
Scientific EffectElectrostatic attraction: Electrostatics

Data Source

PatentUS20260022201A1Polyurethanes, Polishing Articles and Polishing Systems Therefrom and Method of Use Thereof
Publication Date: 2026.01.22 3M INNOVATIVE PROPERTIES CO
  • US20260022201A1 patent drawing
  • US20260022201A1 patent drawing
  • US20260022201A1 patent drawing

AI summary

Polyurethanes and polishing articles made therefrom including a reaction product of a reactive mixture including a polyol, a diol chain extender, a diisocyanate, a mono-alcohol, and a multifunctional amine are described. The mole ratio of isocyanate groups to hydroxyl groups in the reactive mixture is 0.98 or greater. Such polyurethanes may remain stable even at extended exposure to elevated reactive extrusion temperatures.