Radial Thermal Modules for CMP Pad Temperature Uniformity
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Solution Overview
Problem
Chemical mechanical polishing (CMP) processes face challenges in temperature control, leading to variations in polishing pad surface temperature, which affect removal rate, uniformity, and wafer-to-wafer consistency due to the poor thermal conductivity of polishing pads and non-uniform heat generation during the CMP process.
Innovation Solution
A temperature control system with multiple thermal control modules positioned radially above the polishing pad, each equipped with heating or cooling elements, allows for independent temperature control of specific zones on the pad, using infrared light sources, thermoelectric heat pumps, heat exchangers, and fluid dispensers, with sensors to monitor and adjust temperature profiles.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Temperature
If multiple thermal control modules are positioned radially above the polishing pad to control temperature zones independently, then temperature uniformity across the polishing pad is improved, but device complexity increases
Solution Approach 1:
The temperature control system is divided into multiple independent thermal control modules positioned at different radial positions above the polishing pad. Each module can independently control the temperature of its corresponding radial zone, allowing segmented temperature management across the polishing surface. This segmentation enables precise local temperature control while maintaining overall system manageability.
Solution Approach 2:
Different radial zones of the polishing pad are provided with different thermal control characteristics through the distributed thermal control modules. Each module can be independently adjusted to provide the specific temperature control needed for its local region, accounting for variations in heat generation and polishing conditions across different radial positions.
2Temperature
If thermal control modules directly contact the polishing pad or polishing liquid for temperature control, then temperature control effectiveness is improved, but contamination risk and maintenance difficulty increase
Solution Approach 1:
A body or carrier structure serves as an intermediary between the thermal control modules and the polishing pad or polishing liquid. The thermal control modules are positioned within or on this body, which mediates the thermal interaction with the polishing interface. This intermediary approach enables effective temperature control while preventing direct contact between the thermal control components and the polishing materials, thereby reducing contamination risk and facilitating easier maintenance.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution reduces temperature variations across the polishing pad, improving within-wafer and wafer-to-wafer uniformity, and enhances the predictability and repeatability of the polishing process by maintaining a consistent temperature profile.
Implementation Method 1
Each thermal control module of the plurality of thermal control modules is configured to independently heat or cool a radial region of the polishing pad
Implementation Method 2
Each thermal control module can include one or more of an infrared light source, a thermoelectric heat pump, a heat exchanger, a resistive heater, and a fluid dispenser
Implementation Method 3
a stack with a thermoelectric heat pump and a heat exchanger. The heat exchanger may be above the thermoelectric heat pump
Implementation Method 4
Each thermal control module can include one or more of an infrared light source, a thermoelectric heat pump, a heat exchanger, a resistive heater, and a fluid dispenser
Implementation Method 5
Each thermal control module can include one or more of an infrared light source, a thermoelectric heat pump, a heat exchanger, a resistive heater, and a fluid dispenser
Data Source
AI summary
A chemical mechanical polishing apparatus includes a platen to hold a polishing pad, a carrier to hold a substrate against a polishing surface of the polishing pad during a polishing process, a dispenser to supply a polishing liquid to the polishing surface, and a temperature control system including a body configured to contact the polishing surface or the polishing liquid on the polishing surface. The body supports a thermal control module positioned over the polishing pad.


