CMP Torque Monitoring with Multi-Frequency Pressure Segmentation

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Solution Overview

Problem

Conventional motor torque monitoring in chemical mechanical polishing lacks spatial resolution, making it difficult to determine the polishing endpoint accurately due to variations in material removal rates across the substrate.

Innovation Solution

Applying pressures with different frequencies to distinct regions of the substrate using a multi-chamber carrier head, combined with in-situ motor torque monitoring, allows for spatial resolution of friction distribution and precise determination of the polishing endpoint.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional motor torque monitoring is used during CMP, then the polishing process can be monitored in-situ, but the measurement lacks spatial resolution and cannot accurately determine the polishing endpoint

Engineering Contradiction:
Improvepolishing endpoint detection accuracyVSAvoidspatial resolution of friction distribution
Core Design Contradiction:
Measurement precisionVSLoss of information

Solution Approach 1:

The carrier head is divided into multiple independently controllable chambers that apply pressure to different regions of the substrate. Each chamber can apply pressure with a distinct frequency, allowing the motor torque signal to be segmented and analyzed by frequency to determine friction characteristics of specific substrate regions, thereby recovering spatial resolution.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different regions of the substrate receive differentiated pressure applications with unique frequencies. This allows local friction characteristics of each substrate region to be independently measured and analyzed, enabling spatially resolved endpoint detection rather than a single averaged measurement.

Inventive Principle:
Principle #3Local quality

2Manufacturing precision

If pressure is applied uniformly across the substrate, then the polishing process is simple to control, but spatial variations in material removal rate cannot be detected

Engineering Contradiction:
Improvepolishing uniformityVSAvoidpressure application system
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The pressure application system transitions from static uniform pressure to dynamic region-specific pressure modulation. Each chamber can independently vary pressure with different frequencies, allowing the system to adapt to spatial variations in material removal rate and achieve more uniform polishing across the substrate.

Inventive Principle:
Principle #15Dynamics

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enhances polishing uniformity, reduces dishing and residue, and enables reliable halting of the process at the correct endpoint by analyzing the spatial distribution of friction changes.

Implementation Method 1

monitoring the substrate with an in-situ motor torque monitoring system to generate a sequence of measured values

Methodology Applied
Scientific EffectElectromagnetic induction: Electromagnetic Induction

Implementation Method 2

applying a first pressure in a first cyclic waveform having a first frequency to a first region of the substrate, applying a second pressure in a second cyclic waveform having a different second frequency to a different second region of the substrate

Methodology Applied
Scientific EffectFriction: Friction

Data Source

PatentUS12440942B2Pressure signals with different frequencies during friction monitoring to provide spatial resolution
Publication Date: 2025.10.14 APPLIED MATERIALS INC
  • US12440942B2 patent drawing
  • US12440942B2 patent drawing
  • US12440942B2 patent drawing

AI summary

A method of polishing includes holding a substrate with a carrier head against a polishing surface of a polishing pad, generating relative motion between the substrate and polishing pad, applying a first pressure in a first cyclic waveform having a first frequency to a first region of the substrate, applying a second pressure in a second cyclic waveform having a different second frequency to a different second region of the substrate, during polishing of the substrate, monitoring the substrate with an in-situ motor torque monitoring system to generate a sequence of measured values, and determining a relative contribution to the sequence of measured values from the first region and second region based on distinguishing the first frequency from the second frequency.