CMP Wafer Transfer Layout for Shorter Paths and Easier Maintenance

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Solution Overview

Problem

Existing CMP equipment has a low efficiency and complex structure due to the spatial arrangement of polishing units and wafer transfer modules, which affects the overall throughput and requires frequent machine shutdowns for maintenance.

Innovation Solution

The proposed CMP equipment features a novel array layout of polishing units in two rows with a wafer transfer module positioned above, allowing for unobstructed wafer transfer without interference. This design integrates the wafer transfer robot and wet wafer transfer robot, enabling full-range wafer transfer among polishing, in/out, and cleaning stations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If polishing units and wafer transfer modules are arranged in traditional spatial configurations, then wafer transfer can be accomplished, but the structure becomes complex and transfer efficiency decreases

Engineering Contradiction:
Improvewafer transfer efficiencyVSAvoidspatial arrangement complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The patent positions the wafer transfer module vertically above the polishing units, utilizing the vertical dimension rather than horizontal arrangement. This dimensional change allows the transfer module to serve multiple polishing units simultaneously without increasing horizontal footprint or structural complexity, thereby improving transfer efficiency while maintaining simple configuration.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Productivity

If traditional wafer transfer arrangements are used, then polishing can be performed, but frequent machine shutdowns are required for maintenance

Engineering Contradiction:
Improveoverall throughputVSAvoidcontinuous operation capability
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The wafer transfer module is extracted and positioned as a separate, independent component vertically above the polishing units. This separation allows the transfer module to be maintained, repaired, or replaced without affecting the polishing units, enabling continuous operation and improving reliability while maintaining high throughput.

Inventive Principle:
Principle #2Taking out (Extraction)

3Productivity

If polishing units are arranged in arrays with transfer stations, then wafer processing can be performed, but the wafer transfer range is large and efficiency is reduced

Engineering Contradiction:
Improveprocessing efficiencyVSAvoidwafer transfer range
Core Design Contradiction:
ProductivityVSLength of moving object

Solution Approach 1:

By positioning the transfer module in the vertical dimension above the polishing units, the horizontal transfer distance is eliminated. Wafers are transferred vertically through a short, fixed range, dramatically reducing the transfer path length and improving processing efficiency compared to horizontal transfer arrangements.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

4Adaptability or versatility

If shared rotatable devices are used for wafer transfer among multiple polishing units, then space is utilized, but the technological process becomes complicated

Engineering Contradiction:
Improvemulti-unit transfer capabilityVSAvoidtransfer mechanism complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The vertically positioned transfer module serves as a universal interface for multiple polishing units simultaneously. It can load and unload wafers for different polishing units without requiring complex rotatable mechanisms, achieving multi-unit transfer capability through a simple, fixed vertical position that works with all polishing units in the array.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS12251785B2Chemical mechanical planarization equipment, wafer transfer method, and wafer planarization unit
Publication Date: 2025.03.18 HANGZHOU ZHONGGUI ELECTRONICS TECH CO LTD
  • US12251785B2 patent drawing
  • US12251785B2 patent drawing
  • US12251785B2 patent drawing

AI summary

A chemical-mechanical planarization equipment, comprising a polishing module, a cleaning module and a wafer transfer module, wherein the polishing module comprises two rows of polishing unit arrays, each row of polishing unit arrays comprises two or more sets of polishing units, polishing transfer stations corresponding to two rows of polishing unit arrays are longitudinally arranged and located in the row direction of the polishing unit arrays, and a working area of the wafer transfer module is located vertically above the longitudinally arranged polishing transfer stations.