Coating and Developing Apparatus Vertical Stacking Segmentation

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

The increasing complexity of semiconductor manufacturing processes due to the need for finer resist patterns and higher yield leads to a larger footprint of coating and developing apparatuses, which results in reduced operation efficiency when an abnormality occurs or maintenance is required, as the entire system must be stopped.

Innovation Solution

A coating and developing apparatus with a carrier block, processing block, and interface block configuration that allows for vertical stacking of processing units and lateral adjacency of later-stage units, enabling partial operation cessation and maintenance without halting the entire system, utilizing transfer mechanisms to route substrates efficiently between modules.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If multiple diverse processing modules are provided in a processing block to meet demands for finer resist patterns and higher yield, then manufacturing precision and reliability are improved, but device complexity and footprint increase

Engineering Contradiction:
Improveresist pattern precisionVSAvoidprocessing module complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The processing block is divided into multiple independent unit blocks, each capable of performing specific processing functions. These unit blocks are stacked vertically to reduce footprint while maintaining functional independence. Each unit block contains necessary processing modules for its specific function, allowing the system to achieve high manufacturing precision through specialized modules without requiring all modules to be present simultaneously in one location.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Unit blocks are arranged in a vertical stack configuration rather than a horizontal layout. This three-dimensional arrangement reduces the horizontal footprint of the apparatus while accommodating multiple diverse processing modules. The vertical stacking allows early-stage processing units and later-stage processing units to coexist in the same horizontal space at different vertical levels.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Device complexity

If unit blocks are stacked vertically to reduce footprint, then device complexity is reduced, but productivity decreases because the entire system must stop when one module requires maintenance

Engineering Contradiction:
Improveapparatus structureVSAvoidoperation efficiency
Core Design Contradiction:
Device complexityVSProductivity

Solution Approach 1:

The processing block is segmented into multiple independent unit blocks that can operate autonomously. Each unit block is equipped with its own transport mechanism and processing modules, allowing independent operation and maintenance. When one unit block requires maintenance or encounters an abnormality, other unit blocks can continue processing wafers, maintaining overall system productivity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system incorporates dynamic wafer routing capabilities through transfer units and auxiliary transfer mechanisms that can adaptively redirect wafers between different unit blocks. This dynamic routing allows the system to bypass malfunctioning or under-maintenance units and utilize alternative pathways, ensuring continuous operation and high productivity even when individual modules are unavailable.

Inventive Principle:
Principle #15Dynamics

3Reliability

If the entire system stops for maintenance of one processing module, then reliability is improved by ensuring proper maintenance, but loss of time increases due to complete system shutdown

Engineering Contradiction:
Improvesystem reliabilityVSAvoidsystem downtime
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The system is divided into independently maintainable unit blocks. Each unit block can be accessed and maintained separately without affecting other blocks. This modular architecture allows maintenance personnel to service one unit block while other blocks continue normal operations, significantly reducing system downtime while maintaining high reliability through regular maintenance of all components.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The auxiliary transfer mechanism and multiple processing pathways enable continuous wafer processing even when one unit block is down for maintenance. Wafers can be redirected through alternative unit blocks or held in buffer areas, ensuring that the overall system maintains continuous productive operation. This eliminates the need for complete system shutdowns and minimizes loss of time while ensuring all modules receive necessary maintenance.

Inventive Principle:
Principle #20Continuity of useful action

Data Source

PatentUS8888387B2Coating and developing apparatus and method
Publication Date: 2014.11.18 TOKYO ELECTRON LTD
  • US8888387B2 patent drawing
  • US8888387B2 patent drawing
  • US8888387B2 patent drawing

AI summary

In one embodiment, a coating and developing apparatus includes a processing block including a vertical stack of early-stage processing unit blocks; a vertical stack of later-stage processing unit blocks disposed laterally adjacent to respective ones of the early-stage processing unit blocks; a vertical stack of developing unit blocks stacked on the early-stage processing unit blocks; a vertical stack of auxiliary processing unit blocks disposed laterally adjacent to respective ones of the developing unit blocks; first transfer units, each of which are disposed between the laterally adjacent early-stage processing unit and later-stage processing unit; second transfer units, each of which is disposed between the laterally adjacent developing unit block and auxiliary processing unit block; and a auxiliary transfer mechanism for transferring a substrate between the first transfer units and between the second transfer units.