Coaxial Plasma Coil Diameters for Uniform Substrate Processing

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Solution Overview

Problem

Substrate processing apparatuses with coaxially arranged coils face challenges in achieving uniform plasma density, leading to decreased substrate processing uniformity due to overlapping voltage peaks from the coils.

Innovation Solution

A substrate processing apparatus is designed with a first and second coil surrounding the plasma generation space, where the peak of the second voltage distribution does not overlap with the peak of the first voltage distribution, ensuring a non-overlapping voltage peak configuration to enhance plasma uniformity by using coils with different winding diameters and carefully positioning them to prevent arc discharge and improve plasma distribution.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Power

If two coils of the same diameter are arranged coaxially to generate plasma, then plasma generation capability is improved, but plasma density uniformity deteriorates due to overlapping voltage peaks

Engineering Contradiction:
Improveplasma generation capabilityVSAvoidplasma density uniformity
Core Design Contradiction:
PowerVSManufacturing precision

Solution Approach 1:

The patent applies asymmetry by configuring the two coils with different diameters rather than the same diameter. The first coil has a larger diameter than the second coil, which creates non-overlapping voltage peaks and prevents plasma density bias, thereby achieving uniform plasma distribution across the substrate surface while maintaining effective plasma generation capability

Inventive Principle:
Principle #4Asymmetry

Solution Approach 2:

The patent implements local quality by positioning the coils at different radial locations with different diameters. The first coil (larger diameter) and second coil (smaller diameter) are arranged such that their voltage peaks occur at different radial positions, creating locally optimized plasma generation zones that collectively provide uniform plasma density across the entire substrate surface

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration achieves improved uniformity of plasma density along the substrate surface, extending plasma lifetime and ensuring consistent processing results by preventing electric power leakage and maintaining desired plasma generation.

Implementation Method 1

a first coil provided to surround the plasma generation space and configured to generate a first voltage distribution; and a second coil provided to surround the plasma generation space and configured to generate a second voltage distribution

Methodology Applied
Scientific EffectElectromagnetic induction: Electromagnetic Induction

Data Source

PatentUS11923173B2Substrate processing apparatus, substrate processing method, method of manufacturing semiconductor device, and non-transitory computer-readable recording medium
Publication Date: 2024.03.05 KOKUSAI DENKI KK
  • US11923173B2 patent drawing
  • US11923173B2 patent drawing
  • US11923173B2 patent drawing

AI summary

There is provided a technique capable of improving a uniformity of a substrate processing on a substrate surface. According to one aspect thereof, there is provided a substrate processing apparatus including: a substrate processing room; a plasma generation room; a gas supplier supplying a gas into the plasma generation room; a first coil surrounding the plasma generation room and to which an electric power is supplied; and a second coil surrounding the plasma generation room and to which an electric power is supplied. An axial direction of the second coil is equal to that of the first coil, a winding diameter of the second coil is different from that of the first coil, and a peak of a voltage distribution generated by supplying the electric power to the second coil does not overlap with a peak of a voltage distribution generated by the first coil.