Coaxial Interferometer Probe for Recessed Fiber Inspection
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Solution Overview
Problem
Existing fiber optic connector inspection devices are unable to effectively inspect recessed fiber endfaces due to size constraints and lack of interferometric capability, leading to inadequate resolving power and inability to measure endface geometry or detect fiber protrusion within small socket termini.
Innovation Solution
An optical probe with a coaxial two-beam interferometer configuration that splits light into reference and test paths, allowing for interference fringe imaging and microscope imaging modes, enabling inspection of fiber endfaces within compact and environmentally restricted spaces by using gradient index lenses and a dichroic beam splitter for dual wavelength operation without moving parts.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If existing inspection devices are used to inspect recessed fiber endfaces, then the device structure is simple, but the resolving power is inadequate and the device cannot effectively inspect within small socket termini
Solution Approach 1:
The inspection device is segmented into distinct functional modules: a coaxial interferometer module for geometric measurement, a microscope imaging module for visual inspection, and a dual-wavelength light source system. Each module operates independently but integrates seamlessly, allowing high-resolution inspection without requiring a completely complex monolithic structure.
Solution Approach 2:
The device combines multiple inspection functions into a single unified system that can operate in both interferometric mode for geometric measurement and microscope imaging mode for visual inspection. The dual-wavelength light source enables the same optical path to serve different measurement purposes, reducing overall device complexity while maintaining high resolving power.
2Adaptability or versatility
If interferometric capability is added to inspection devices, then the ability to measure endface geometry and detect protrusion is improved, but the device complexity increases
Solution Approach 1:
The interferometer and microscope imaging systems are merged into a single integrated probe with shared optical components. The beam splitter divides the light path into interferometric and imaging modes, allowing both capabilities to coexist in one device without requiring separate independent systems.
Solution Approach 2:
The device uses parameter changes in the light source (switching between first and second wavelengths) to toggle between interferometric and imaging modes. This allows the same physical hardware to adapt its function based on the wavelength parameter, reducing the need for mechanical switches or separate optical paths.
3Ease of operation
If the inspection device is made compact for small socket termini, then the ease of operation in restricted spaces is improved, but the resolving power and interferometric capability are compromised
Solution Approach 1:
The optical components are nested within a compact probe structure that fits within small socket termini. The coaxial arrangement of the light source, beam splitter, and detectors allows the entire interferometric system to be packed into a small volume while maintaining the necessary optical path lengths for high-resolution measurement.
Solution Approach 2:
The device transitions from traditional planar inspection geometries to a coaxial three-dimensional arrangement where the light source and detectors are positioned along the optical axis. This dimensional change allows the probe to access recessed areas while maintaining sufficient optical path length for high resolving power through the coaxial geometry.
4Adaptability or versatility
If a dual-wavelength light source is used for both interference fringe imaging and microscope imaging modes, then the versatility is improved, but the device complexity increases
Solution Approach 1:
A single dual-wavelength light source serves both interferometric and imaging functions by emitting at different wavelengths. The beam splitter is configured to route the first wavelength for interferometric measurement and the second wavelength for imaging, allowing one light source to perform multiple functions without requiring separate illumination systems.
Solution Approach 2:
The light source operates at different wavelengths (first and second wavelengths) to switch between functional modes. By changing the wavelength parameter, the same optical path and beam splitter configuration enable the device to operate in either interferometric mode or imaging mode, simplifying the overall system architecture.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The optical probe achieves high-resolution imaging and interferometric capability, allowing for accurate measurement of fiber endface geometry and detection of protrusions, even in small socket termini, with enhanced mechanical stability and versatility for various inspection tasks.
Implementation Method 1
a first beam splitter that intersects the optical axis and splits the light from the at least one optical source into a first beam for traveling along a reference path... and a second beam for traveling along a test path
Implementation Method 2
a first lens interposed along the reference path between the reference surface and the first beam splitter and a second lens interposed between the first beam splitter and the specimen
Implementation Method 3
The first beam reflects off the reference surface and the second beam reflects off the specimen such that the two beams interfere along an imaging path
Data Source
AI summary
An optical probe has optical components of an interferometer and includes an optical axis, at least one optical source for emitting light along an illumination path that is at least partially coaxial with the optical axis, a first beam splitter and a first lens. The first beam splitter intersects the optical axis and splits the light from the at least one optical source into a first beam for traveling along a reference path that is coaxial with the optical axis to a reference surface and a second beam for traveling along a test path that is coaxial with the optical axis to a specimen. The first lens is interposed along the reference path.