Coaxial Probe Contact Structure for Fine-Pitch Semiconductor Testing
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Solution Overview
Problem
Conventional test devices face challenges in maintaining reliable contact and minimizing signal loss when testing high-frequency and high-speed semiconductors due to the large diameter of coaxial cables and the need for direct contact at fine pitches, which affects the reliability and efficiency of signal transmission.
Innovation Solution
A test device design featuring a coaxial cable with an exposed core and a signal probe in direct contact, where the core is reinforced with a conductive material and the contact portion is extended and bent to ensure reliable contact, and a cable supporter aligns the coaxial cable with the probe hole to maintain contact and reduce noise interference.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the core of the coaxial cable is exposed and extended to contact the signal probe directly, then contact reliability is improved, but the core may be bent or damaged due to lack of support
Solution Approach 1:
The core reinforcer is pre-installed inside the coaxial cable core before the insulation layer is removed, providing structural support in advance to prevent bending and damage when the core is exposed for contact with the signal probe
Solution Approach 2:
The core structure is enhanced by combining the conductive core material with a core reinforcer made of different material properties, creating a composite structure that maintains both electrical conductivity and mechanical strength
2Reliability
If the coaxial cable uses a standard insulated structure, then protection and insulation are provided, but the large diameter makes direct contact with the signal probe difficult when pitch between contact points is small
Solution Approach 1:
The insulation layer is selectively removed only from the portion of the coaxial cable that needs to contact the signal probe, while the rest of the cable maintains its insulation structure, thus reducing the effective contact diameter without compromising overall insulation protection
Solution Approach 2:
The coaxial cable structure is modified locally at the contact portion by removing insulation only where needed, while maintaining the standard insulated structure in other areas, allowing direct contact at the probe interface while preserving protection elsewhere
Data Source
AI summary
Disclosed is a test device for testing an electric characteristic of an object to be tested. The test device includes a block comprising a probe hole, a probe supported in the probe hole and retractably configured to connect a first contact point and a second contact point, and a coaxial cable comprising an insulated sheath, a main core surrounded with the insulated sheath, and a probe contact portion exposed from the insulated sheath and extended from the main core so as to be in contact with the probe. An axis of the probe is spaced apart from an axis of the coaxial cable, and the probe contact portion is extended from the main core toward the axis of the probe.