CMP Composition for Cobalt Polishing with Neutral pH and Corrosion Inhibitors
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current chemical mechanical polishing (CMP) compositions for semiconductor substrates containing cobalt and cobalt alloys face challenges such as high corrosion, low material removal rates, and incompatibility with low k dielectric materials, leading to issues like dishing and delamination, particularly due to acidic pH and the need for separate corrosion inhibitors.
Innovation Solution
A CMP composition comprising inorganic particles, a substituted aromatic compound with carboxylic acid functions as a corrosion inhibitor, amino acids, hydrogen peroxide as an oxidizer, and an aqueous medium, optimized to operate within a neutral to alkaline pH range (7-10), which improves corrosion inhibition and adjustability of material removal rates.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If acidic pH CMP composition is used, then material removal rate of copper and cobalt is improved, but corrosion of cobalt increases and dishing occurs
Solution Approach 1:
The patent changes the pH parameter from acidic to neutral range (pH 7-9), fundamentally altering the chemical environment to reduce cobalt corrosion while maintaining effective material removal through the synergistic action of substituted aromatic carboxylic acids and amino acids
Solution Approach 2:
The patent introduces substituted aromatic carboxylic acids and amino acids as intermediary substances that mediate between the polishing particles and cobalt surface, providing corrosion inhibition while enabling controlled material removal through chemical complexation
2Productivity
If oxidizer is added to CMP composition, then polishing performance is improved, but dissolution of cobalt adhesion layer increases causing delamination
Solution Approach 1:
The substituted aromatic carboxylic acids and amino acids act as intermediary protective agents that form complexation layers on the cobalt surface, preventing direct contact between the oxidizer and cobalt adhesion layer, thus avoiding dissolution and delamination while maintaining polishing effectiveness
Solution Approach 2:
The corrosion inhibitors (substituted aromatic carboxylic acids and amino acids) are pre-added to the CMP composition to establish protective complexation on cobalt surfaces before oxidative polishing begins, preventing harmful dissolution in advance
3Object-affected harmful factors
If separate corrosion inhibitor is used, then corrosion protection is improved, but device complexity and process steps increase
Solution Approach 1:
The patent merges the corrosion inhibition function with the polishing slurry composition itself by incorporating substituted aromatic carboxylic acids and amino acids directly into the CMP formulation, eliminating the need for separate corrosion inhibitor applications or process steps
4Productivity
If material removal rate is increased, then productivity is improved, but dishing of copper lines occurs
Solution Approach 1:
The patent adjusts multiple parameters including pH (to neutral 7-9), chemical composition (substituted aromatic carboxylic acids and amino acids), and oxidizer concentration to achieve an optimized balance that enables high material removal rates while maintaining surface flatness and preventing dishing through controlled chemical-mechanical interaction
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The composition achieves high cobalt material removal rates with reduced corrosion and improved surface quality, compatibility with low k dielectric materials, and stability, while minimizing dishing and delamination risks.
Implementation Method 1
a substituted aromatic compound with at least one carboxylic acid function as a corrosion inhibitor
Implementation Method 2
at least one amino acid
Implementation Method 3
at least one oxidizer
Implementation Method 4
inorganic particles
Data Source
AI summary
A chemical mechanical polishing (CMP) composition (Q) for chemical mechanical polishing of a substrate (S) containing (i) cobalt and/or (ii) a cobalt alloy, wherein the CMP composition (Q) contains: (A) Inorganic particles, (B) a substituted aromatic compound with at least one carboxylic acid function as corrosion inhibitor, (C) at least one amino acid, (D) at least one oxidizer, (E) an aqueous medium, wherein the CMP composition (Q) has a pH of from 7 to 10.


