Code Testing on Operating Chip via Execution Flag Audit

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Solution Overview

Problem

Existing code testing solutions are prone to test loopholes and incur unnecessary costs due to independent testing of software executable files without actual working scenarios, leading to increased expenses and reduced reliability.

Innovation Solution

A code testing method that involves loading and executing code sets on an operating chip to identify and audit subsets that fail execution, using execution flag bits to determine successful execution and perform targeted audit testing, thereby improving reliability and reducing costs.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If code testing is performed on software executable files independently without actual working scenarios, then testing can be conducted separately, but test loopholes increase and testing reliability decreases

Engineering Contradiction:
Improvetesting efficiencyVSAvoidtesting reliability
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent merges the code execution environment with the actual working scenario by loading and executing code sets directly on the operating chip. This integration allows testing to occur in the real operational context rather than in isolation, eliminating test loopholes while maintaining testing efficiency.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The operating chip serves multiple functions: it operates as the actual working component and simultaneously functions as the testing platform. By executing code sets directly on the chip, the system achieves both normal operation and security verification without requiring separate testing infrastructure.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Reliability

If comprehensive audit testing is performed on entire code sets, then testing reliability improves, but testing costs and time increase

Engineering Contradiction:
Improvetesting reliabilityVSAvoidtesting time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent segments the code set into smaller code subsets and uses execution flag bits to identify only those subsets that failed execution. This segmentation allows the system to focus audit testing resources on specific problematic segments rather than performing comprehensive testing on the entire code set, reducing testing time while maintaining reliability.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Instead of performing full audit testing on all code, the system performs partial testing only on code subsets that exhibited execution failures. This targeted approach applies excessive action only where needed (failed subsets) rather than uniformly across the entire code base, optimizing the balance between reliability and time consumption.

Inventive Principle:
Principle #16Partial or excessive action

3Ease of manufacture

If code testing is performed in isolation from actual working scenarios, then testing setup is simpler, but test loopholes increase and unnecessary costs are incurred

Engineering Contradiction:
Improvetesting setup simplicityVSAvoidtesting completeness
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The operating chip performs self-testing by executing code sets on itself during normal operation. The chip's own execution infrastructure is utilized for verification purposes, eliminating the need for external testing equipment or complex test setup while ensuring comprehensive testing coverage in the actual working environment.

Inventive Principle:
Principle #25Self-service

Data Source

PatentUS11940902B2Code testing method, apparatus and device, and computer-readable storage medium
Publication Date: 2024.03.26 HANGZHOU VANGO TECH
  • US11940902B2 patent drawing
  • US11940902B2 patent drawing
  • US11940902B2 patent drawing

AI summary

The invention discloses a code testing method. The method includes the following steps of: acquiring a code set to be tested; loading the code set to a corresponding operating chip, and executing the code set by using the operating chip; judging whether a target code subset which is not successfully executed exists in the code set; and if yes, performing an audit testing operation on the code set. The code testing method provided by the invention is simple and feasible to apply, which improves a testing reliability and reduces a testing cost. The invention also discloses a code testing apparatus and device, and a storage medium, which have corresponding technical effects.