COG OLED Pin Reduction via Dummy Data Lines
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Solution Overview
Problem
COG-typed organic electroluminescent cells require multiple pins for defect detection, leading to pad breakage due to the internal formation of scan lines, which complicates the defect detection process and increases the number of pins needed.
Innovation Solution
Incorporation of dummy data lines and scan lines connected through separate sections, allowing a single pin to contact these lines for defect detection, reducing the overall number of pins required and enabling safer detection without breaking the data and scan line pads.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If multiple scan line pads are formed toward the interior of the cell in COG-typed organic electroluminescent cell, then defect detection capability is improved, but the number of pins required increases and pad breakage risk increases
Solution Approach 1:
The cell is divided into a cell section and a connecting section. The connecting section contains the scan line pads and is separated from the cell section by a scribe line. This segmentation allows the scan line pads to be positioned in the connecting section rather than the cell section, enabling defect detection without requiring pins to contact pads within the cell area, thus reducing pin count while maintaining detection capability.
Solution Approach 2:
The scan line pads are extracted from the cell section and placed in the connecting section. This extraction allows the pads to be accessed by pins from the side rather than requiring pins to penetrate through the cell structure, reducing the number of pins needed and eliminating the risk of pad breakage during pin insertion.
2Ease of manufacture
If scan lines are cut off by scribing blade with the ends of the pads in the scribing process, then cell integration is improved, but the pads become vulnerable to breakage
Solution Approach 1:
The scribe line is positioned to extend beyond the ends of the scan line pads in the connecting section. This preliminary design ensures that when the scribing blade cuts along the scribe line, it naturally separates the connecting section from the cell section without applying stress to the pad connections, thus preventing pad breakage while achieving proper cell integration.
3Measurement precision
If many pins are required for detecting defect of the pixels, then defect detection coverage is improved, but the operation complexity and risk of pad damage increase
Solution Approach 1:
The connecting section acts as an intermediary between the cell section and the external pin contacts. By placing scan line pads in the connecting section, the design allows pins to contact pads through a dedicated interface area rather than requiring multiple pins to penetrate the cell structure, reducing operational complexity while maintaining comprehensive defect detection coverage.
Data Source
AI summary
The present invention relates to a COG-typed organic electroluminescent device including dummy data lines formed at different location from data lines. The COG-typed organic electroluminescent cell having a plurality of pixels formed in the luminescent areas which are cross areas of indium tin oxide films (ITO films) and metal line layers includes data line pads, dummy data lines, and a dummy data line connecting section. The data line pads each are connected to one end of the ITO films. The dummy data lines each are connected to the other end of the ITO films. The dummy data line connecting section connects the dummy data lines. In the cell, the dummy lines are formed separately from the pads, and thus the number of pins may be reduced.