Coherent Diffraction Detection for Elastic Element Deflection
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Solution Overview
Problem
Current micro- and nanosensor technologies face challenges in detecting the deflection of miniaturized elastic elements, particularly when the number of elements increases, as existing methods become complex and limited by optical resolution and diffraction effects, making it difficult to measure forces exerted by multiple cells or detect small masses simultaneously.
Innovation Solution
A method and device utilizing a diffraction image generated by coherently illuminated periodic elastic elements, allowing detection in Fourier space, which simplifies the measurement of deflection and enables the use of external detection even at nanometer scales, facilitating the detection of cell forces and particle concentrations with increased sensitivity and statistical accuracy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If conventional optical reflection measurement is used to detect cantilever deflection, then external detection is possible with simple setup, but the method becomes impractical when sensor dimensions are reduced to nanometer range
Solution Approach 1:
The patent replaces conventional optical reflection measurement with scattering-based detection. Instead of measuring reflected light from the cantilever surface, the method uses light scattering from particles deposited on the cantilever, enabling detection at nanometer scales where reflection becomes impractical.
Solution Approach 2:
The patent changes the detection parameter from reflected light intensity to scattered light intensity. By measuring the scattering of light from particles on the cantilever surface, the system achieves sensitivity at nanometer dimensions while maintaining external detection capability.
2Measurement precision
If electronic on-chip detection is used for nanometer-scale sensors, then detection is possible at reduced dimensions, but the system becomes complex and expensive with significant outlay
Solution Approach 1:
The patent replaces complex electronic on-chip detection with optical scattering-based detection. By using light scattering from particles deposited on the cantilever, the system achieves nanometer-scale detection without requiring complex reading electronics, thereby reducing device complexity and cost.
3Measurement precision
If optical reflection measurement is used for force sensors with multiple columns, then deflection detection is possible, but optical resolution is limited by diffraction effects
Solution Approach 1:
The patent replaces optical reflection measurement with scattering-based detection. By measuring the scattering of light from particles on the column surfaces, the system overcomes diffraction limitations and achieves higher resolution deflection detection for multiple columns simultaneously.
4Measurement precision
If conventional force sensors detect individual cell forces, then measurement is possible, but it becomes very complex to obtain significant statistics about cell forces
Solution Approach 1:
The patent merges the detection of multiple columns into a single integrated measurement system. By using scattering-based detection that can simultaneously measure deflection in multiple columns, the system enables parallel measurement of many cell forces, thereby obtaining significant statistics efficiently without increasing complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for the simultaneous detection of deflection in multiple elastic elements with high accuracy, enabling the measurement of small forces and masses without the need for complex electronics, and allows for the determination of statistical characteristics of cell activity and vitality with a single intensity measurement, even with thousands of columns.
Implementation Method 1
A diffraction image is generated of the illuminating light scattered by the arrangement of elastic elements
Implementation Method 2
a diffraction image is generated of the illuminating light scattered by the arrangement of elastic elements
Data Source
AI summary
Shown are a device (26) and a method for detecting the deflection of a plurality of elastic elements (22), wherein the elastic elements (22) can be deflected out of a rest position against a restoring force and are suitable as resonators and/or for measuring a force acting on a respective elastic element (22). The elastic elements (22) are arranged periodically, The arrangement of the elastic elements (22) is illuminated using light, the coherence length of which is larger than the average spacing of adjacent elastic elements (22). A diffraction image is hereby created of the illuminating light scattered on the arrangement of elastic elements (22), and at least a portion of the diffraction image is detected by an optical sensor (32) directly or after interaction with further optical components. The detected image or image signal is subsequently analyzed in order to determine information relating to the deflection state of the elastic elements (22) therefrom.