Coil Reliability Test Device Using Periodic Switching
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Solution Overview
Problem
Current reliability test devices for coils fail to effectively diagnose abnormalities in the life failure mode without causing abnormalities in the current or overvoltage failure modes, particularly when using metal magnetic materials prone to insulation failures.
Innovation Solution
A test device comprising a first and second measurement terminal, a direct-current power source, a semiconductor switch (such as an FET), and a voltage limiting element like a voltage regulator diode, which applies and limits counter electromotive forces to simulate long-term voltage stress on coils, allowing for the measurement of characteristic values to diagnose life failure mode abnormalities without inducing current or overvoltage failures.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If electric current is applied to the coil for diagnosis, then abnormality detection capability is improved, but heat generation causes current failure mode abnormalities
Solution Approach 1:
The test device applies electric current periodically through repeated ON/OFF cycles of the semiconductor switch, enabling life failure mode diagnosis through cumulative voltage stress while limiting current exposure duration to prevent heat-related current failures
2Measurement precision
If voltage is applied to the coil for life failure mode diagnosis, then diagnostic capability is improved, but excessive voltage causes overvoltage failure mode abnormalities
Solution Approach 1:
The test device changes voltage parameters by applying rated voltage repeatedly through controlled semiconductor switching, achieving life failure mode diagnosis through cumulative stress while maintaining voltage within safe limits to prevent overvoltage failures
3Measurement precision
If duration of electric current application is extended, then diagnostic accuracy is improved, but current failure mode abnormalities occur due to heat
Solution Approach 1:
The test device uses periodic current application through repeated switch cycles to accumulate diagnostic data over time while keeping each individual current pulse short, thereby maintaining diagnostic accuracy without causing heat-related failures
Solution Approach 2:
The test device achieves continuous diagnostic effect through repeated cycling, maintaining cumulative exposure for accurate life failure mode detection while interspersing rest periods to prevent heat accumulation and current failures
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables reliable diagnosis of coil abnormalities in the life failure mode while preventing failures in the current and overvoltage modes, ensuring efficient and accurate testing of coil reliability.
Implementation Method 1
a voltage limiting element for limiting a counter electromotive force to a first voltage, the counter electromotive force being applied to the first coil when the first semiconductor switch is turned off
Implementation Method 2
the voltage limiting element is a voltage regulator diode
Data Source
AI summary
A test device according to an embodiment of the present invention includes: a first measurement terminal connected to one end of a first coil to be tested; a second measurement terminal connected to another end of the first coil; a direct-current power source connected to the first measurement terminal; a first semiconductor switch connected between the second measurement terminal and a ground; and a drive unit for turning on and off the first semiconductor switch.