Cold Electron Beam Ionization Source for Mass Spectrometer Accuracy
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Solution Overview
Problem
Time-of-flight mass spectrometers face challenges in achieving high accuracy and miniaturization while maintaining low power consumption, as existing systems struggle with minimizing ionization time differences and efficient ion detection.
Innovation Solution
The design incorporates a cold electron supply part using a microchannel plate and channeltron electron multiplier, driven by ultraviolet rays, to generate and focus electron beams for ionization, with an ion separation part having a straight tube shape and vacuum environment, enabling precise ion detection and miniaturization.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional electron beam ionization is used, then ionization capability is achieved, but ionization time differences increase reducing measurement accuracy
Solution Approach 1:
The patent changes the temperature parameter of the electron beam from conventional thermal electrons to cold electrons (near absolute zero), which fundamentally alters the electron energy distribution and reduces ionization time differences, thereby improving mass measurement accuracy
Solution Approach 2:
The patent employs pulsed electron beam injection where electrons are injected in periodic pulses rather than continuously, allowing precise timing control and minimizing ionization time differences between ions of different masses
2Measurement precision
If traditional mass spectrometer design is used, then ion detection capability is achieved, but system size becomes large
Solution Approach 1:
The patent nests multiple functional components within a compact vacuum chamber, including the microchannel plate, channeltron multiplier, and ion detection region, allowing high-performance ion detection in a minimized system volume
Solution Approach 2:
The patent uses a straight tube-shaped ion separation path instead of traditional curved or spiral paths, optimizing the spatial arrangement to achieve effective ion separation with minimal system volume
3Quantity of substance
If conventional electron multiplication is used, then electron beam intensity is sufficient, but power consumption increases
Solution Approach 1:
The patent replaces conventional thermal electron generation and multiplication systems with a microchannel plate-based cold electron multiplication system that uses electric field acceleration instead of thermal processes, achieving high electron beam intensity with lower power consumption
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration results in high accuracy and low power consumption, allowing for the miniaturization of time-of-flight mass spectrometers with reduced ionization time differences, enhancing detection precision and reducing system size.
Implementation Method 1
a microchannel plate receiving ultraviolet rays to thereby emit the electron beams
Implementation Method 2
a channeltron electron multiplier multiplying the electron beams emitted from the microchannel plate
Implementation Method 3
Time-of-flight mass spectrometers can ionize molecules having masses different from each other in a sample
Implementation Method 4
Time-of-flight mass spectrometers can measure masses of ions by using time-of flight of the ions
Data Source
AI summary
Provided is a time-of-flight mass spectrometer including: an ionization part receiving electron beams to thereby emit ions; a cold electron supply part injecting the electron beams to the ionization part; an ion detection part detecting the ions emitted from the ionization part; and an ion separation part connecting the ionization part and the ion detection part, wherein the cold electron supply part includes a microchannel plate receiving ultraviolet rays to thereby emit the electron beams, the ions emitted from the ionization part pass through the ion separation part to thereby reach the ion detection part, and the ion separation part has a straight tube shape.


