Color Profile Comparison Using Hyperspectral Area Measurement
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Solution Overview
Problem
Existing methods for determining color profiles in printing processes suffer from inaccuracies due to point-based measurements, leading to incorrect determination of color gamuts and potential misclassification of printability, especially when using spectral spot measuring devices.
Innovation Solution
A method utilizing hyperspectral area measuring devices to capture and analyze larger sections of printed patterns, calculating average values to create reference and decor-specific color profiles, and comparing these profiles to ensure accurate color fidelity throughout the printing process.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Speed
If spectral spot measuring devices are used for color measurement, then measurement speed is improved, but measurement precision deteriorates due to point-based measurements that cannot represent the entire color profile accurately
Solution Approach 1:
The patent divides the color profile target into multiple sections (e.g., left, center, right sections) and measures each section separately using spectral spot measuring devices. This segmentation allows the system to capture spatial variations in color reproduction across the target area, resolving the contradiction by making multiple rapid point measurements that collectively represent the entire profile with high precision.
Solution Approach 2:
The patent combines the measurement data from multiple sections into a comprehensive color profile that represents the entire target. By merging the results from different spatial locations, the system achieves both speed (through parallel measurement of multiple sections) and precision (through representative sampling of the entire area).
2Device complexity
If point-based measurements are used to determine color profiles, then device complexity is reduced, but manufacturing precision deteriorates leading to incorrect color gamut determination
Solution Approach 1:
The patent segments the color profile target into multiple measurable sections, allowing simple spectral spot measuring devices to achieve high precision by systematically sampling different areas. This segmentation approach maintains device simplicity while improving manufacturing precision through comprehensive spatial coverage.
Solution Approach 2:
The patent transitions from single-point measurement to multi-point spatial measurement by introducing the spatial dimension. By measuring multiple sections across different locations, the system achieves accurate color gamut determination without increasing device complexity, as each individual measurement remains simple while the collective measurement provides comprehensive precision.
3Measurement precision
If area-wide measurements are performed using hyperspectral measuring devices, then color fidelity is improved, but device complexity and measurement time increase
Solution Approach 1:
The patent segments the measurement task into multiple discrete section measurements rather than requiring a single complex area-wide measurement. This allows the use of simpler spectral spot measuring devices performed multiple times at different locations, achieving high color fidelity through comprehensive sampling without the complexity of hyperspectral area scanning.
Solution Approach 2:
The patent creates multiple copies of the measurement process by measuring different sections of the color profile target separately. Each section is measured using the same simple spectral spot measuring device, and the results are combined to represent the entire profile. This copying approach achieves area-wide measurement precision without requiring a single complex hyperspectral device.
4Measurement precision
If multiple sections of color profile targets are measured and averaged, then measurement precision is improved, but measurement time increases
Solution Approach 1:
The patent segments the color profile into multiple sections that can be measured in parallel or sequential manner. By dividing the measurement task, the system achieves high precision through comprehensive sampling while minimizing total measurement time through efficient multi-section measurement protocols.
Solution Approach 2:
The patent implements continuous measurement of multiple sections without interruption, maintaining useful measurement action throughout the process. By measuring different sections in a continuous sequence rather than with interruptions, the system achieves high precision through comprehensive data collection while minimizing idle time and maximizing measurement efficiency.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach significantly reduces inaccuracies in color gamut determination, ensuring high color fidelity and accurate printability assessments by providing area-wide measurements and allowing for real-time adjustments to printing parameters.
Implementation Method 1
measuring devices for measuring printed patterns, in particular for measuring color profiles of printed patterns
Data Source
Figure 1
Figure 2A~2B
AI summary
The present invention relates to a method for comparing a reference color profile or the color gamut of the reference color profile of an analog reference pattern with a decor-specific color profile or the color gamut of the decor-specific color profile of a digital or analog decor. In the course of the method, a reference color profile is generated by reading and storing measurement data of at least a section of an analog reference pattern using a hyperspectral area measuring device. According to the invention, a decor-specific color profile is generated either from the digital data of a digital decor or by hyperspectral area measurement of at least a section of an analog decor.