Column ADC Imaging Circuit With Buffered Counter Timing
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Solution Overview
Problem
The propagation delay differences between count values stored in the N memory and S memory in column ADC-based solid-state imaging devices lead to fixed noise components, causing image deterioration, especially in dark states where pixel reset and signal readout voltages are equivalent.
Innovation Solution
Incorporating a first and second buffer to manage count values for the N and S signals, respectively, which reduces the impact of propagation delays by buffering signals uniformly before storage, ensuring accurate digital correlated double sampling.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If propagation delay compensation is not implemented, then device complexity is reduced, but measurement precision deteriorates due to offset errors in pixel signal extraction
Solution Approach 1:
A delay adjustment circuit is introduced as an intermediary component between the counter and the storing units. This circuit includes a delay adjustment unit that can compensate for propagation delays and a switch unit that selects between different delay states. The intermediary circuit enables precise timing control without requiring complex synchronized clock distribution or multiple counters, thus improving measurement precision while maintaining reasonable device complexity.
2Reliability
If buffers are added to stabilize count values, then fixed noise components are reduced, but device complexity increases
Solution Approach 1:
Buffers are strategically placed before the storing units to pre-stabilize count values. The first buffer is positioned between the delay adjustment circuit and the first storing unit, while the second buffer is positioned between the delay adjustment circuit and the second storing unit. This preliminary action ensures that count values are stabilized before being stored, preventing propagation delay variations from introducing fixed noise components. The buffer placement is optimized to achieve stability with minimal additional complexity.
3Ease of manufacture
If propagation delay differences are not compensated, then circuit design is simplified, but image quality deteriorates due to fixed noise components
Solution Approach 1:
The delay adjustment circuit changes the timing parameter of count pulse propagation by introducing controllable delays. The delay adjustment unit can modify the propagation delay of count pulses to different storing units, thereby equalizing the timing parameters across columns. This parameter change approach allows the system to compensate for inherent propagation delay differences without requiring complex structural modifications, maintaining ease of manufacture while eliminating fixed noise components that would otherwise degrade image quality.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach effectively minimizes fixed noise components in each column, enhancing image quality by synchronizing count value propagation and reducing offset noise.
Implementation Method 1
a plurality of pixels arranged in a matrix, each of the plurality of pixels configured to generate a signal by photoelectric conversion
Data Source
AI summary
A solid-state imaging device includes a plurality of pixels arranged in a matrix, a plurality of readout circuits provided in each column of the plurality of pixels arranged in a matrix, configured to read out for each column a signal of the plurality of pixels, a plurality of comparison units configured to compare a signal output from the plurality of readout circuits with a reference signal whose level changes with time, a counter configured to perform a count operation from when the level of the reference signal starts to change, first and second buffers each configured to buffer a count value of the counter, and a plurality of storing units connected to the plurality of comparison units, configured to store a count value of the counter when a magnitude relation between a signal output from the plurality of the readout circuits and the reference signal is inverted.


