Combined Light Scattering and Optical Imaging Particle Sizing
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Solution Overview
Problem
Existing methods for measuring particle size distributions face challenges in accuracy, particularly for small particles using light scattering and large particles using imaging, due to interference from background scatter and limited diffraction resolution, respectively.
Innovation Solution
Combining light scattering and optical imaging methods, where light scattering measures small particles and imaging measures large particles, with overlapping size ranges to create a comprehensive particle size distribution, using separate but synchronized light sources and sample cells to minimize interference and enhance accuracy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If light scattering is used to measure small particles, then measurement precision for small particles is improved, but background scatter interference worsens measurement accuracy for large particles
Solution Approach 1:
The particle size measurement range is segmented into two distinct ranges: small particles (10 nm to 1 μm) measured by light scattering and large particles (1 μm to 1 mm) measured by optical imaging. This segmentation allows each method to operate in its optimal performance range, avoiding the interference issues that arise when a single method attempts to measure the entire size range.
Solution Approach 2:
The patent transitions from a single-dimensional measurement approach (one method for all sizes) to a two-dimensional approach by combining light scattering (for small particles) and optical imaging (for large particles). This dimensional expansion in the measurement space enables comprehensive coverage of the full particle size spectrum while maintaining high precision in each segment.
2Measurement precision
If optical imaging is used to measure large particles, then measurement precision for large particles is improved, but diffraction resolution limits measurement of small particles
Solution Approach 1:
The measurement capability is segmented by assigning optical imaging to large particles where it excels and light scattering to small particles where it overcomes the diffraction limit. This segmentation resolves the contradiction by ensuring each method operates only in the size range where it provides superior precision.
Solution Approach 2:
The patent merges two complementary measurement systems—light scattering and optical imaging—into a unified particle size distribution analysis platform. By combining these methods with overlapping size ranges, the system achieves continuous coverage from 10 nm to 1 mm, eliminating the measurement gaps and resolution limits that would exist if either method were used alone.
3Device complexity
If a single measurement method is used for all particle sizes, then device complexity is reduced, but measurement accuracy across the full size range deteriorates
Solution Approach 1:
The patent creates a universal particle size measurement system that can accurately measure particles across the entire size range from 10 nm to 1 mm by integrating multiple measurement functions. The system uses light scattering for small particles and optical imaging for large particles, with both methods contributing to a comprehensive particle size distribution, thus achieving multi-functionality without sacrificing accuracy.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This combination provides accurate particle size measurements across a broader range, leveraging the strengths of each method to overcome limitations in existing technologies, ensuring representative and precise particle size data.
Implementation Method 1
A first particle size distribution is determined from light scattering measurements
Implementation Method 2
a second particle size distribution is determined from imaging measurements
Data Source
AI summary
The present invention comprises methods and apparatus for measuring light scattering from particles and images of particles, and for combining size distributions from the measurements to produce a single size distribution over a larger size range.