Combined RF Test Arrangement for Beamforming Devices
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Solution Overview
Problem
Testing beamforming devices requires multiple test arrangements and equipment, making the process time-consuming and costly due to the need for different setups for analyzing modulated signals and power emissions, which often necessitate precise positioning and rearrangement of the device under test.
Innovation Solution
A combined test arrangement that integrates signal analyzing devices for modulated signal analysis and power analyzing devices for power measurement, allowing multiple tests to be performed in a single setup without moving the device, using a single test configuration that can handle modulated signal analyses and power measurements simultaneously, with optional mechanical positioning for adaptive testing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If multiple different test arrangements are used for different tests, then measurement precision is improved, but loss of time increases due to device rearrangement
Solution Approach 1:
The patent combines multiple test arrangements (modulated signal test arrangement and power emission test arrangement) into a single integrated test arrangement. The device under test is positioned once and remains in the same location for both modulated signal analysis and power emission measurements, eliminating the need for rearrangement and reducing testing time while maintaining measurement precision through dedicated analysis devices for each test type
Solution Approach 2:
The test arrangement is designed with universal functionality to perform multiple types of tests (modulated signal analysis and power emission measurements) simultaneously or sequentially on the same device under test. The arrangement includes both signal analyzing devices for modulated signals and power analyzing devices for power emissions, making the system multi-functional without requiring device repositioning
2Measurement precision
If multiple different test arrangements are used for different tests, then measurement precision is improved, but device complexity increases
Solution Approach 1:
Instead of maintaining separate test arrangements for modulated signal analysis and power emission measurements, the patent merges both test capabilities into a single integrated arrangement. This reduces the overall complexity of having multiple separate systems while maintaining the measurement precision of both test types through dedicated analysis devices within the unified arrangement
3Ease of operation
If the device is repositioned for different tests, then ease of operation is improved for individual tests, but productivity decreases due to repeated positioning
Solution Approach 1:
The test arrangement is designed as a universal platform that can perform both modulated signal analysis and power emission measurements without requiring device repositioning. This multi-functionality maintains ease of operation for individual tests while significantly improving productivity by eliminating repeated positioning operations and enabling comprehensive testing in a single setup
Data Source
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AI summary
The present invention provides to a test arrangement and a test method for testing a device under test. In particular, a test arrangement is provided comprising a device for vectorial analysis of measurement signals and at least one further device for analysing only the power of radio frequency signals related to the device under test. By simultaneously operating the device for vectorial analysis and the device for analysing the power, an efficient testing can be achieved.