Combined X-ray Generator for Simultaneous Transmission and Backscatter Scanning
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Solution Overview
Problem
Existing security inspection technologies using X-ray transmission and backscatter imaging separately suffer from missed detections due to their inherent limitations, necessitating an integration of both technologies to enhance detection range and performance.
Innovation Solution
A combined scanning X-ray generator that independently emits both pencil and fan X-ray beams, allowing for simultaneous backscatter and transmission scanning in a single apparatus, which can be used in multiple inspection channels to detect various substances effectively.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If X-ray transmission imaging technology is used separately, then high spatial resolution and good penetrability are achieved, but detection sensitivity to low atomic number substances is poor
Solution Approach 1:
The patent combines transmission imaging and backscatter imaging technologies into a single integrated system. The transmission imaging component provides high spatial resolution and penetrability for detecting high atomic number substances, while the backscatter imaging component complements it by offering sensitivity to low atomic number substances. This merging resolves the contradiction by making both technologies work together rather than separately.
Solution Approach 2:
The integrated inspection system is designed to perform multiple functions: transmission imaging for high atomic number substance detection and backscatter imaging for low atomic number substance detection. This multi-functionality allows a single system to address both detection needs, resolving the limitation of each individual technology.
2Object-affected harmful factors
If backscatter imaging technology is used separately, then low radiation dose and good safety are achieved, but penetration ability is limited
Solution Approach 1:
The system merges backscatter imaging (low radiation dose, good safety) with transmission imaging (high penetration ability). By combining these technologies, the system maintains the safety advantages of backscatter imaging while compensating for its limited penetration ability through the transmission imaging component.
Solution Approach 2:
The integrated system performs both backscatter imaging for safety-conscious applications and transmission imaging for penetration-required applications, making the system universally applicable to various inspection scenarios with different requirements.
3Adaptability or versatility
If a single X-ray generator is designed to emit both pencil beam and fan beam, then detection range is expanded and inspection efficiency is improved, but device complexity increases
Solution Approach 1:
The X-ray generator is designed as a universal device capable of emitting both pencil beams (for backscatter imaging) and fan beams (for transmission imaging). This multi-functional design expands detection range and inspection efficiency while managing complexity through integrated architecture rather than separate devices.
Solution Approach 2:
The system dynamically switches between pencil beam and fan beam emission modes based on inspection requirements. This dynamic operation allows a single generator to serve multiple purposes, expanding adaptability while avoiding the need for permanently complex multi-configuration hardware.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The combined scanning X-ray generator improves detection efficiency and adaptability by enabling simultaneous emission of X-ray beams of different energies, expanding the detection range and enhancing the identification of both high and low atomic number substances, thus improving overall security inspection performance.
Implementation Method 1
a pencil beam radiation source arranged at the first end of the anode and configured to emit a pencil X-ray beam, wherein the pencil beam radiation source includes a first cathode configured to emit electrons toward the first end of the anode
Implementation Method 2
a fan beam radiation source arranged at the second end of the anode and configured to emit a fan X-ray beam, wherein the fan beam radiation source includes a second cathode configured to emit electrons toward the second end of the anode
Implementation Method 3
the pencil beam radiation source and configured to emit a pencil X-ray beam applicable to perform a backscatter scanning on a target to be inspected
Implementation Method 4
the fan beam radiation source and configured to emit a fan X-ray beam applicable to perform a transmission scanning on a target to be inspected
Data Source
AI summary
Embodiments of the present disclosure disclose a combined scanning X-ray generator, a composite inspection apparatus and an inspection method. The combined scanning X-ray generator includes: a housing; an anode arranged in the housing, the anode including a first end of the anode and a second end of the anode opposite the first end of the anode; a pencil beam radiation source arranged at the first end of the anode and configured to emit a pencil X-ray beam; and a fan beam radiation source arranged at the second end of the anode and configured to emit a fan X-ray beam; wherein the pencil beam radiation source and the fan beam radiation source are operated independently.