Storage Device Combo IC Event Data Channel Segmentation
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Solution Overview
Problem
Highly integrated semiconductor storage devices face challenges in accurately reading event data due to failure in recognizing external hosts or electrical over stress issues, leading to reduced reliability.
Innovation Solution
A storage device with a non-volatile memory, combo integrated circuit, and temperature sensor, connected through multiple channels, which records and outputs event data based on temperature, overvoltage, overcurrent, and error correction data, using different channels for internal and external host control.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If the storage device uses a single channel for both internal controller communication and external host communication, then the device complexity is reduced, but the reliability deteriorates when the controller fails to recognize the external host or experiences electrical over stress
Solution Approach 1:
The patent divides the communication path into two separate channels: a first channel connecting the controller to the combo IC for internal communication, and a second channel connecting the external host to the combo IC for external communication. This segmentation allows event data to be read through the second channel even when the controller fails, thereby resolving the contradiction between device complexity and reliability.
2Ease of operation
If the storage device uses the controller as the sole intermediary for all communications, then the ease of operation is improved, but the reliability deteriorates when the controller experiences electrical over stress or fails to recognize the external host
Solution Approach 1:
The patent introduces the combo IC as an intermediary component that can directly communicate with the external host through the second channel, bypassing the controller when necessary. This allows event data to be read even when the controller is compromised, resolving the contradiction between ease of operation and reliability by providing a fallback communication path.
3Device complexity
If the storage device records event data only in the controller's memory, then the device complexity is reduced, but the reliability deteriorates when the controller fails to perform debugging operations
Solution Approach 1:
The patent combines the controller's memory with the combo IC's memory to create a redundant storage system for event data. The combo IC includes its own memory space that can store event data independently of the controller, ensuring that debugging information is preserved even when the controller fails, thereby resolving the contradiction between device complexity and debugging reliability.
Data Source
AI summary
A storage device includes a non-volatile memory device that includes memory blocks each including one or more memory cells, a combo integrated circuit (IC) that includes a temperature sensor and a memory, and a controller that is connected with the combo IC through first channels and controls the non-volatile memory device to write or read data in or from selected memory cells. When the controller determines that a first event occurs based on temperature data read from the combo IC, the controller records first event data in the memory of the combo IC. In a first operation mode, the combo IC outputs the first event data to the controller through the first channels. In a second operation mode, under control of an external host, the combo IC outputs the first event data to the external host through second channels different from the first channels.