Common Electrode Integrity Testing via Jitter Value Ratios
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Solution Overview
Problem
Existing electronic device testing methods lack reliability in verifying the operational characteristics and electrical connection relationships of elements such as display layers and sensor layers, particularly in determining the integrity of the common electrode.
Innovation Solution
The method involves measuring jitter values across channels formed by first and second electrodes in the sensor layer, calculating average and summed jitter values, and testing the common electrode by dividing the summed jitter values by the average, with predetermined thresholds to determine electrode integrity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If existing electronic device testing methods are used, then the testing process is simple, but the reliability of verifying operational characteristics and electrical connection relationships is insufficient
Solution Approach 1:
The patent segments the sensor layer into multiple first electrodes and second electrodes that insulatively intersect, creating multiple independent channels. Each channel is tested separately through jitter value measurement, allowing localized defect detection. This segmentation enables reliable verification of electrical connection relationships without requiring complex overall testing procedures.
Solution Approach 2:
The patent replaces traditional visual or physical inspection methods with electrical measurement techniques. By measuring jitter values of channels formed by intersecting electrodes and calculating ratios to detect unformed common electrodes, the system substitutes mechanical/visual verification with electrical signal analysis, significantly improving testing reliability while maintaining procedural simplicity.
2Measurement precision
If simple testing methods are used, then the testing process is easy to operation, but the ability to accurately determine electrode integrity is insufficient
Solution Approach 1:
The patent introduces jitter values as an intermediary measurement parameter to assess electrode integrity. Instead of directly measuring complex electrical properties, the system measures jitter values of channels formed by first and second electrodes, then uses the ratio of summed to average jitter values as an intermediate indicator to determine common electrode formation status. This intermediary approach enables precise detection while maintaining operational simplicity.
Solution Approach 2:
The patent transforms the testing approach by changing the measurement parameter from direct electrical property measurement to jitter value measurement. By defining jitter values as a new parameter and using their ratios to determine electrode integrity, the system achieves precise measurement capability while keeping the testing operation straightforward and interpretable.
3Reliability
If traditional testing methods are used, then the testing procedure is straightforward, but the reliability in determining common electrode integrity is insufficient
Solution Approach 1:
The patent segments the common electrode verification into multiple channel-based measurements. By measuring jitter values across multiple channels formed by different first and second electrode combinations, and analyzing the distribution of these values, the system preserves detailed information about electrode integrity. This segmentation prevents information loss by providing multiple data points for comprehensive analysis.
Solution Approach 2:
The patent implements feedback through the calculation and comparison of jitter value ratios. The ratio of summed jitter values to average jitter values provides feedback information about common electrode formation quality. By comparing this ratio against predetermined thresholds, the system reliably determines electrode integrity while maintaining complete information about the tested channels.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enhances the reliability of electronic device testing by accurately determining the common electrode's status, distinguishing between defective and normal electrodes, and identifying unformed electrodes through measurable jitter value differences.
Implementation Method 1
sensing mutual capacitance from the plurality of second electrodes, and sensing the plurality of jitter values based on the mutual capacitance
Data Source
AI summary
An electronic device testing method includes providing an electronic device including a display layer including a common electrode and a sensor layer that is disposed on the display layer and that includes a plurality of first electrodes and a plurality of second electrodes that insulatively intersect the plurality of first electrodes, measuring a plurality of jitter values of a plurality of channels formed by the plurality of first electrodes and the plurality of second electrodes, calculating a first value being an average of the plurality of jitter values, calculating a second value by summing jitter values, among the plurality of jitter values, of channels formed by one of the plurality of second electrodes among the plurality of channels, and testing the common electrode based on a third value obtained by dividing the second value by the first value.