Common Glass Substrate Acoustic Wave Resonators With Spinel BAW

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Solution Overview

Problem

Current bulk acoustic wave resonators face challenges in achieving high-quality factor (Q) values and maintaining RF performance due to issues like energy leakage and mobilized electrons at the oxide-silicon interface, which affect their characteristics and manufacturing processes.

Innovation Solution

The use of a spinel substrate, such as a polycrystalline magnesium aluminate, for bulk acoustic wave resonators, which reduces tangent loss, enhances mechanical strength, and simplifies processing by forming a sacrificial layer directly over the substrate, thereby minimizing etching and eliminating mobilized electrons and holes, and allowing for better RF characteristics.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If high-resistivity silicon substrates are used for bulk acoustic wave resonators, then manufacturing process complexity is reduced, but substrate resistivity decreases and quality factor values deteriorate due to mobilized electrons and holes at the oxide-silicon interface

Engineering Contradiction:
Improvemanufacturing process complexityVSAvoidquality factor
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The patent changes the substrate material parameter from silicon to spinel (magnesium aluminate), which fundamentally alters the electrical properties at the interface. This material substitution eliminates the mobilization of electrons and holes that occurs at oxide-silicon interfaces, thereby maintaining high substrate resistivity and achieving superior quality factor values while remaining manufacturable

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent employs a sacrificial layer approach where a temporary layer is deposited on the spinel substrate, patterned, and then removed to create the desired resonator structure. This copying methodology simplifies the manufacturing process by enabling standard photolithography and etching techniques to be used on the spinel substrate

Inventive Principle:
Principle #26Copying

2Reliability

If spinel substrates are used for bulk acoustic wave resonators, then quality factor values and mechanical strength are improved, but manufacturing process complexity increases due to additional processing steps

Engineering Contradiction:
Improvequality factorVSAvoidmanufacturing process complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent applies preliminary action by depositing a sacrificial layer directly onto the spinel substrate before proceeding with resonator fabrication. This pre-deposited layer serves as a template that guides subsequent patterning and etching steps, simplifying the overall manufacturing process despite the novel substrate material

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The sacrificial layer acts as an intermediary element between the spinel substrate and the final resonator structure. It enables the transfer of patterns from photomasks to the substrate through standard fabrication techniques, bridging the gap between the novel spinel material and conventional manufacturing processes

Inventive Principle:
Principle #24Intermediary (Mediator)

3Ease of manufacture

If oxide-silicon interfaces are used in bulk acoustic wave resonators, then manufacturing is simplified, but energy loss increases due to mobilized electrons and holes affecting RF performance

Engineering Contradiction:
Improvemanufacturing simplicityVSAvoidtangent loss
Core Design Contradiction:
Ease of manufactureVSLoss of energy

Solution Approach 1:

The patent changes the interface material parameter by replacing silicon with spinel substrate. This fundamental material substitution eliminates the formation of oxide-silicon interfaces and the associated mobilization of electrons and holes, thereby reducing energy loss and achieving lower tangent loss values while maintaining manufacturing feasibility

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The spinel substrate-based bulk acoustic wave resonators exhibit improved RF performance, mechanical strength, and reduced substrate resistivity, enabling better processability and quality factor values compared to high-resistivity silicon substrates, while allowing for the implementation of both BAW and SAW resonators on a common substrate.

Implementation Method 1

The ceramic substrate is a polycrystalline ceramic substrate

Methodology Applied
Scientific EffectPolycrystalline structure:

Implementation Method 2

Acoustic waves propagate in a bulk of a piezoelectric layer

Methodology Applied
Scientific EffectPiezoelectric effect: Piezoelectric Effect

Implementation Method 3

a SAW filter can include an interdigital transductor electrode on a piezoelectric substrate and can generate a surface acoustic wave on a surface of the piezoelectric layer

Methodology Applied
Scientific EffectElectrostatic actuation: Electrostatic Induction

Data Source

PatentUS11349454B2Acoustic wave devices with common glass substrate
Publication Date: 2022.05.31 SKYWORKS GLOBAL PTE LTD
  • US11349454B2 patent drawing
  • US11349454B2 patent drawing
  • US11349454B2 patent drawing

AI summary

An acoustic wave component is disclosed. The acoustic wave component can include a bulk acoustic wave resonator and a surface acoustic wave device. The bulk acoustic wave resonator can include a first portion of a glass substrate, a first piezoelectric layer positioned on the glass substrate, and electrodes positioned on opposing sides of the first piezoelectric layer. The surface acoustic wave device can include a second portion of the glass substrate, a second piezoelectric layer positioned on the glass substrate, and an interdigital transducer electrode on the second piezoelectric layer.