Common-Substrate Power Device Integration With Buried-Well Clamping

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Solution Overview

Problem

Current power management systems for portable electronic devices face challenges in miniaturization and cost due to the high product cost of power switches and parasitic impedances, which hinder high-frequency applications and efficient power conversion.

Innovation Solution

The integration of power devices, including MOSFETs, BJTs, and diodes, on a common silicon substrate using BiCMOS technology with dielectric lateral isolation, allowing for a monolithic integration of driver stages and power switches, reducing parasitic impedances and increasing operating frequency.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Volume of moving object

If power switches are integrated on the same substrate as control circuitry, then device miniaturization is achieved, but manufacturing cost increases due to large die area allocation to power switches

Engineering Contradiction:
Improvedevice sizeVSAvoidmanufacturing cost
Core Design Contradiction:
Volume of moving objectVSEase of manufacture

Solution Approach 1:

The patent divides the integrated circuit into separate functional blocks: control circuitry blocks and power switch blocks. This segmentation allows each block to be optimized independently for its specific function, enabling cost-effective manufacturing while achieving device miniaturization through systematic integration of these segmented blocks on the same substrate.

Inventive Principle:
Principle #1Segmentation

2Volume of moving object

If power switches are integrated on the same substrate as control circuitry, then device miniaturization is achieved, but parasitic impedances increase which hinder high-frequency applications

Engineering Contradiction:
Improvedevice sizeVSAvoidparasitic impedances
Core Design Contradiction:
Volume of moving objectVSObject-affected harmful factors

Solution Approach 1:

The patent introduces separate power supply blocks as intermediary elements between the control circuitry and power switches. These intermediary blocks serve as buffer zones that electrically isolate the control circuitry from the high-current power switches, thereby reducing parasitic coupling and impedance while enabling compact integration of all functional blocks on the same substrate.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Volume of moving object

If power switches are integrated on the same substrate as control circuitry, then device miniaturization is achieved, but power conversion efficiency decreases due to parasitic impedances

Engineering Contradiction:
Improvedevice sizeVSAvoidpower conversion efficiency
Core Design Contradiction:
Volume of moving objectVSLoss of energy

Solution Approach 1:

The patent employs separate power supply blocks as intermediary elements that electrically isolate control circuitry from power switches. This intermediary structure reduces parasitic coupling and impedance, thereby minimizing energy loss and improving power conversion efficiency while maintaining compact integration of all functional blocks on the same substrate.

Inventive Principle:
Principle #24Intermediary (Mediator)

Data Source

PatentUS20230420497A1Power device integration on a common substrate
Publication Date: 2023.12.28 SILANNA ASIA
  • US20230420497A1 patent drawing
  • US20230420497A1 patent drawing
  • US20230420497A1 patent drawing

AI summary

A semiconductor structure for facilitating an integration of power devices on a common substrate includes a first insulating layer formed on the substrate and an active region having a first conductivity type formed on at least a portion of the first insulating layer. A first terminal is formed on an upper surface of the structure and electrically connects with at least one other region having the first conductivity type formed in the active region. A buried well having a second conductivity type is formed in the active region and is coupled with a second terminal formed on the upper surface of the structure. The buried well and the active region form a clamping diode which positions a breakdown avalanche region between the buried well and the first terminal. A breakdown voltage of at least one of the power devices is a function of characteristics of the buried well.