Compact DUT Characterization System Using Optical Subsystem and Measurement Array
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Solution Overview
Problem
Conventional antenna array test and calibration methods are inefficient for integrated antenna arrays with no RF connectors, particularly for mmWave frequencies and 5G applications, as they require time-consuming over-the-air testing and are not suitable for characterizing the performance of integrated transceiver chains within anechoic chambers.
Innovation Solution
A system using a measurement array with multiple array elements in an anechoic chamber, configured to measure far-field characteristics and angular dependence of integrated antenna arrays, allowing for simultaneous multi-channel and fast antenna profile measurements by positioning the antenna array within a beam overlap region and using an optical subsystem with multiple focal planes to transform far-field patterns into near-field patterns.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If conventional over-the-air testing methods are used for integrated antenna arrays, then the testing can be performed without RF connectors, but the testing time becomes excessively long and productivity decreases
Solution Approach 1:
The patent divides the integrated antenna array into multiple testable segments by using a probe array that can independently test individual antenna elements. The probe array consists of multiple probe elements that can be selectively activated to test different portions of the integrated antenna array, enabling parallel testing that significantly reduces overall testing time while maintaining compatibility with integrated designs that lack RF connectors.
Solution Approach 2:
The patent replaces the conventional mechanical connection system (RF connectors and coaxial cables) with an electromagnetic field-based measurement system. A probe array uses electromagnetic near-field coupling to interface with the integrated antenna array elements, eliminating the need for physical RF connectors while enabling faster automated testing through electronic control of the probe elements.
2Measurement precision
If far-field measurement techniques are used for antenna characterization, then measurement precision can be achieved, but the required chamber size becomes impractically large
Solution Approach 1:
The patent transforms the measurement problem from three-dimensional far-field spherical wave measurements to two-dimensional near-field planar measurements. By using a probe array that scans across a planar surface in the near-field region, the system captures antenna radiation characteristics without requiring the large spherical measurement volume needed for far-field tests, thereby reducing chamber size while maintaining measurement capability through mathematical transformation.
Solution Approach 2:
The patent introduces a probe array as an intermediary measurement device that indirectly characterizes the integrated antenna array. Instead of directly measuring far-field radiation patterns which require large chambers, the probe array measures near-field electromagnetic coupling, and these measurements are mathematically transformed to derive far-field antenna patterns, enabling accurate characterization in a compact chamber environment.
3Measurement precision
If multiple beam angles and configurations are tested for integrated antenna arrays, then comprehensive performance characterization is achieved, but the testing time increases significantly
Solution Approach 1:
The patent enables continuous measurement across multiple beam angles and configurations by using a probe array that can continuously scan different spatial positions and orientations. Instead of discrete step-by-step measurements that require reconfiguration between test points, the system performs continuous sweeping measurements that capture antenna performance across the entire angular range in an uninterrupted sequence, significantly reducing total testing time while maintaining comprehensive characterization.
Solution Approach 2:
The patent performs preliminary calibration and characterization of the probe array response before conducting the actual antenna array measurements. This preliminary action includes measuring and storing the probe element patterns and mutual coupling effects, which are then used to de-embed and correct the measured data during the actual testing. This preprocessing eliminates the need for repeated calibration measurements during the multi-angle testing sequence, reducing overall testing time while ensuring measurement accuracy across all beam configurations.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables fast and accurate characterization of integrated antenna arrays, including transmitter and receiver chains, in a compact anechoic chamber, reducing testing time and improving measurement precision for EVM, ACLRs, and antenna profiles, while accommodating large far-field distances and mmWave frequencies.
Implementation Method 1
an optical subsystem with multiple focal planes to transform far-field patterns into near-field patterns
Implementation Method 2
Anechoic test ranges are shielded chambers with walls covered in absorbing material that minimizes internal reflections
Data Source
AI summary
A system is provided for characterizing a device under test (DUT) including an integrated antenna array. The system includes an optical subsystem having first and second focal planes, where the integrated antenna array is positioned in a beam overlap region extending from the first focal plane of the optical subsystem. The system further includes a measurement array having multiple array elements positioned substantially on the second focal plane of the optical subsystem, the measurement array being configured to receive signals from the DUT, and/or to transmit substantially collimated beams to the DUT, via the optical subsystem. Far-field characteristics of the DUT are measured, as well as angular dependence of each of the far-field characteristics.