Compact Opto-Electrical Probe With Unified Test Interfaces
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Solution Overview
Problem
Wafer-level testing of hybrid optical and electrical components is challenging due to the large size of conventional testing equipment and the compact size of modern high-speed opto-electric devices, leading to inefficiencies and alignment issues with separate mechanical assemblies for electrical and optical connections.
Innovation Solution
A compact opto-electrical probe with integrated electrical and optical interfaces in a single module, utilizing a transparent or semitransparent membrane and flexible optical fiber to allow simultaneous electrical and optical testing by aligning electrical terminals with electrical contacts and optically aligning with optical components through a light path in the membrane.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If separate mechanical assemblies are used for electrical and optical connections, then electrical and optical testing can be performed independently, but the equipment size becomes large and alignment issues occur with compact opto-electric devices
Solution Approach 1:
The patent combines separate electrical and optical testing functions into a single integrated probe assembly. The probe includes both electrical contacts for electrical testing and an optical fiber for optical testing, allowing both types of testing to be performed simultaneously or sequentially through the same mechanical interface, thereby reducing equipment size while maintaining testing capability.
Solution Approach 2:
The probe assembly is designed as a universal interface that can perform multiple functions: electrical contact through metallic terminals, optical communication through fiber optic coupling, and mechanical positioning. This multi-functional design eliminates the need for separate specialized equipment for electrical and optical testing.
2Reliability
If separate mechanical assemblies are used for electrical and optical connections, then electrical and optical testing can be performed independently, but alignment issues occur with compact opto-electric devices
Solution Approach 1:
By merging electrical and optical interfaces into a single probe assembly with unified mechanical positioning, the invention ensures that electrical contacts and optical fiber are positioned relative to each other with high precision. The integrated design allows both interfaces to be aligned simultaneously to the same target location on the opto-electric device, eliminating alignment errors that would occur with separate assemblies.
Solution Approach 2:
The invention replaces complex separate mechanical positioning systems with a simplified integrated mechanical structure. The single probe assembly uses one set of positioning mechanisms to control both electrical and optical interfaces, reducing the number of moving parts and potential alignment errors while improving measurement precision.
3Ease of operation
If electrical paths are routed through a membrane, then electrical connections can be made through the optical path area, but light transmission is blocked by electrical traces
Solution Approach 1:
The membrane is segmented into distinct functional zones: electrical trace regions for electrical conduction and optical clear regions for light transmission. The electrical paths are routed only in areas where light does not need to pass through, while the optical regions remain free of obstructions. This spatial segmentation allows both electrical connectivity and optical transmission to function simultaneously without interference.
Solution Approach 2:
Different regions of the membrane have different properties: areas with electrical traces have high electrical conductivity but low optical transmission, while optical clear regions have low electrical conductivity but high optical transmission. This local differentiation of properties allows the membrane to serve dual functions of electrical connection and optical transmission in different locations.
4Area of stationary object
If a compact integrated probe is used, then equipment size is reduced and alignment is improved, but manufacturing complexity increases
Solution Approach 1:
The probe uses a thin flexible membrane as the base structure, which can be manufactured using standard PCB or thin-film fabrication techniques. Electrical traces are deposited on the membrane in predetermined patterns, and optical clear regions are left open or filled with transparent material. This approach simplifies manufacturing compared to assembling multiple rigid components, despite the integrated functionality.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient simultaneous electrical and optical testing of closely spaced opto-electric devices at the wafer level, reducing chip size and cost, and improving diagnostic efficiency by allowing early issue detection.
Implementation Method 1
material that forms the membrane transmits light, the light path being an optical hole (315) composed of the material of the membrane
Data Source
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AI summary
Described are various configurations for performing efficient optical and electrical testing of an opto-electrical device using a compact opto-electrical probe. The compact opto-electrical probe can include electrical contacts arranged for a given electrical contact layout of the opto-electrical device, and optical interface with a window in a probe core that transmits light from the opto-electrical device. An adjustable optical coupler of the probe can be mechanically positioned to receive light from the device's emitter to perform simultaneous optical and electrical analysis of the device.