Compact Probe Assembly for In-Situ Machine Part Positioning
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Solution Overview
Problem
Existing high-precision measuring devices are bulky, costly, and unsuitable for small or nano-scale components, as they require complex setups and cannot accurately determine the relative position of machine parts without distorting the components during measurement.
Innovation Solution
A three-dimensional measuring assembly with a probe having a carrying structure equipped with position detectors and coupling means, allowing direct fixation to components for precise on-site measurement, eliminating the need for bulky devices and enabling measurement during assembly.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If existing high-precision measuring devices are used, then measurement precision is improved, but device complexity and cost increase significantly
Solution Approach 1:
The patent combines the probing function and measuring function into a single integrated probe assembly. The probe includes a spherical contact part for engaging reference apertures and a carrying structure with position detectors that directly measure the probe's position, eliminating the need for separate bulky measuring devices while maintaining high measurement precision
Solution Approach 2:
The patent replaces complex mechanical measuring systems with a simplified probe-based system that uses position detectors (such as optical or electromagnetic sensors) to directly determine the probe's position. This substitution reduces mechanical complexity while preserving measurement accuracy
2Measurement precision
If existing measuring devices are used, then measurement precision is improved, but the devices become bulky and unsuitable for small components
Solution Approach 1:
The probe integrates the spherical contact part and carrying structure with position detectors into a compact, miniaturized assembly that can access small reference apertures in nanoscale components while maintaining the capability to perform high-precision measurements
Solution Approach 2:
The measuring system is segmented into a small, portable probe that can be manually or automatically positioned, separating the measurement function from the large, stationary measuring device infrastructure, thereby enabling measurement of small components without requiring bulky equipment
3Difficulty of detecting and measuring
If components are removed for measurement, then measurement accessibility is improved, but measurement time and operational disruption increase
Solution Approach 1:
The probe is designed to directly engage with reference apertures on components while they remain installed in the machine, allowing the measurement system to serve itself by accessing components in situ without requiring removal, disassembly, or special positioning operations
Solution Approach 2:
The probe assembly is designed with universal coupling means that can interact with various component types and reference aperture configurations, enabling the same probe to measure different components in their installed positions without requiring component removal or specialized measurement fixtures
Data Source
AI summary
The present invention relates to a three-dimensional measuring assembly for determining the relative position of components, such as machine parts and/or instruments. The invention also relates to a method for determining the relative position of components, such as more particularly machine parts, using a reference member according to any of the foregoing claims.