Compact Fourier Spectrometer Using Overlapping Beam Interference

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Solution Overview

Problem

Existing spectral measurement devices for biological components require expensive drive mechanisms for high accuracy or increase in device size to enhance wavelength resolution, leading to challenges in non-invasive measurement.

Innovation Solution

A spectral measurement device that combines light into a single parallel beam, divides it into two beams with an optical path length difference using a phase shifter, and detects overlapping regions on a detector to obtain an interferogram for high wavelength resolution without increasing device size.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a movable mirror with high-accuracy drive mechanism is used to obtain accurate spectral characteristics, then measurement precision is improved, but device complexity and cost increase

Engineering Contradiction:
Improvespectral characteristics accuracyVSAvoiddrive mechanism complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent replaces the mechanical movable mirror system with an acousto-optic modulator (AOM) that uses acoustic waves to diffract light. This substitutes a mechanical scanning system with an acoustic field-based system, eliminating the need for precision mechanical stages and motors while achieving the same optical path difference function through acoustic modulation of the light beam

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent introduces acoustic waves as an intermediary to create optical path differences. Instead of physically moving mirrors, acoustic waves modulate the refractive index of the medium, causing light to experience different optical paths based on the acoustic frequency and amplitude, thereby achieving spectral measurement without mechanical movement

Inventive Principle:
Principle #24Intermediary (Mediator)

2Measurement precision

If the device size is increased to enhance wavelength resolution, then measurement precision is improved, but device compactness deteriorates

Engineering Contradiction:
Improvewavelength resolutionVSAvoiddevice size
Core Design Contradiction:
Measurement precisionVSVolume of moving object

Solution Approach 1:

The patent transitions from a one-dimensional mechanical scanning approach to a two-dimensional acoustic field modulation approach. By using acoustic waves propagating in a different dimension (through the medium rather than moving components), the system achieves equivalent or superior wavelength resolution in a more compact footprint

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent changes the fundamental parameter for creating optical path differences from physical displacement (mirror position) to acoustic frequency and amplitude. This parameter change allows for precise control of optical path differences without the physical space requirements of mechanical scanning, enabling high wavelength resolution in a compact device

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Accurately measures spectral characteristics with high wavelength resolution while maintaining a compact device size by using a phase shifter with overlapping light beams and a two-dimensional detector.

Implementation Method 1

light emitted from a measurement point of an object to be measured is combined into one parallel light beam by means of a combining optical system

Methodology Applied
Scientific EffectLight: Light

Implementation Method 2

an objective lens, and a phase shifter

Methodology Applied
Scientific EffectOptical focusing: Lens

Implementation Method 3

the phase shifter is configured to divide a parallel light beam combined in the combining optical system into a first light beam and a second light beam while providing an optical path length difference between the first light beam and the second light beam

Methodology Applied
Scientific EffectOptical path difference: Interference

Implementation Method 4

a detector having a light-receiving face and configured to detect an intensity distribution of light on the light-receiving face

Methodology Applied
Scientific EffectLight intensity detection: Photoelectric Effect

Implementation Method 5

obtain an interferogram at the measurement point based on an intensity distribution of light in the region where the incident region of the first light beam and the incident region of the second light beam on the light-receiving face overlap, and acquire a spectrum by Fourier-transforming the interferogram

Methodology Applied
Scientific EffectInterference: Interference

Implementation Method 6

acquire a spectrum by Fourier-transforming the interferogram

Methodology Applied
Scientific EffectFourier transformation:

Data Source

PatentEP3809103B1Spectrometer and spectroscopic method
Publication Date: 2025.11.19 KAGAWA UNIVERSITY
  • EP3809103B1 patent drawingFigure 1A~2A
  • EP3809103B1 patent drawingFigure 2B~3B
  • EP3809103B1 patent drawingFigure 3C~4

AI summary

The present invention includes: combining light emitted from a measurement point of an object to be measured into one parallel light beam by means of a combining optical system; dividing, by a phase shifter, a parallel light beam emitted from the combining optical system into a first light beam and a second light beam, emitting the first light beam and the second light beam toward the light-receiving face while providing an optical path length difference between the first light beam and the second light beam, and causing the first light beam and the second light beam to planarly enter the light-receiving face so that at least a part of an incident region of the first light beam on the light-receiving face and at least a part of an incident region of the second light beam overlap with each other; and obtaining an interferogram at the measurement point based on an intensity distribution of light in a region where an incident region of the first light beam and an incident region of the second light beam on the light-receiving face overlap, and acquiring a spectrum by Fourier-transforming the interferogram.