Compact X-ray Analysis Device Integrating Valence and Crystallinity Detection

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Solution Overview

Problem

Existing devices are large and cumbersome, making it difficult to detect the valence of elements and crystallinity of samples efficiently, as they require large radiation facilities and separate devices for valence and crystallinity analysis.

Innovation Solution

A compact analysis device integrating an X-ray diffractometer and wavelength-dispersive X-ray fluorescence analysis, equipped with an X-ray source, detectors, and a signal processing device to detect valence and crystallinity using X-rays, allowing for simultaneous detection of valence and crystallographic data without the need for sample transfer.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a large radiation facility is used to detect valence and crystallinity, then detection capability is improved, but device size becomes large and cumbersome

Engineering Contradiction:

Improvedetection capabilityVSAvoiddevice size

Core Design Contradiction:

Measurement precisionVSVolume of moving object

Solution Approach 1:

The patent combines two separate analysis functions (valence detection via wavelength-dispersive X-ray fluorescence and crystallinity detection via X-ray diffraction) into a single integrated device. The X-ray source and detection system serve both analytical purposes simultaneously, eliminating the need for separate large-scale facilities while maintaining detection capabilities.

Inventive Principle:

Principle #5Merging (Combining)

Solution Approach 2:

The X-ray analysis device is designed to perform multiple functions: it can detect both the valence state of elements (through characteristic X-ray energy analysis) and the crystalline structure of samples (through diffraction pattern analysis). This multi-functional approach allows a single compact device to replace multiple specialized instruments.

Inventive Principle:

Principle #6Universality (Multi-functionality)

2Measurement precision

If separate devices are used for valence and crystallinity analysis, then specialized detection is improved, but analysis time increases due to sample transfer

Engineering Contradiction:

Improvespecialized detectionVSAvoidanalysis time

Core Design Contradiction:

Measurement precisionVSLoss of time

Solution Approach 1:

The patent integrates valence detection and crystallinity detection into a single device with a common X-ray source and sample stage. Both measurements can be performed on the same sample without removal or transfer, enabling sequential or simultaneous analysis that significantly reduces the time loss associated with moving samples between instruments.

Inventive Principle:

Principle #5Merging (Combining)

Solution Approach 2:

The device enables continuous analysis by maintaining the sample in position while performing multiple measurements. The X-ray source continuously irradiates the sample, and detectors simultaneously or sequentially collect data for both valence and crystallinity analysis, eliminating interruptions caused by sample transfer and maintaining uninterrupted analytical action.

Inventive Principle:

Principle #20Continuity of useful action

3Measurement precision

If multiple separate instruments are used, then detection accuracy is improved, but device complexity increases

Engineering Contradiction:

Improvedetection accuracyVSAvoiddevice complexity

Core Design Contradiction:

Measurement precisionVSDevice complexity

Solution Approach 1:

The patent merges the functional components of separate valence and crystallinity analyzers into a unified system. The X-ray source, sample holder, and detection mechanisms are shared between both analytical modes, reducing the total number of components while preserving the specialized detection capabilities needed for accurate measurements.

Inventive Principle:

Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables efficient detection of valence and crystallinity in a single, smaller device, reducing analysis time and improving inspection accuracy by performing both valence and crystallographic data analysis concurrently.

Implementation Method 1

an X-ray source configured to emit X-rays to a sample

Methodology Applied

Scientific EffectX-ray emission: X-Ray

Implementation Method 2

a first detector configured to detect characteristic X-rays generated from the sample by X-ray irradiation

Methodology Applied

Scientific EffectX-ray detection: X-Ray

Implementation Method 3

a second detector configured to detect X-rays diffracted by the sample

Methodology Applied

Scientific EffectX-ray diffraction: Bragg Diffraction

Data Source

PatentUS11471119B2Analysis device and analysis method

Publication Date: 2022.10.18 SHIMADZU CORP

AI summary

A valence of a target element of a sample and crystallinity of a sample can be detected with a small device. The analysis device 100 includes: a placement holder 110 for placing a sample S; an X-ray source 11 for irradiating the sample S with X-rays; a first detector 141 for detecting characteristic X-rays generated from the sample S by the irradiation of the X-rays; a second detector 142 for detecting X-rays diffracted by the sample; and a signal processing device 20. The signal processing device 20 detects the valence of the target element of the sample based on the characteristic X-rays detected by the first detector 141, and detects the crystallographic data of the sample based on the X-rays detected by the second detector 142.