Comparator Circuit With Current Mirror for Fast Low-Offset ADCs
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current comparators in analog-to-digital converters face a trade-off between accuracy and speed, with high-precision comparators being slow and fast comparators lacking in accuracy, making it difficult to achieve both high accuracy and high speed simultaneously.
Innovation Solution
A comparator design incorporating a first current source circuit, pre-amplifier circuit, amplifier circuit with a current mirror and differential diode-connected transistor, and an output circuit, which amplifies input signals using a current mirror to achieve high gain and reduce offset, thereby enhancing both accuracy and speed.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If high-precision comparator design is used, then measurement precision is improved, but speed deteriorates
Solution Approach 1:
The comparator is divided into multiple functional stages: a first amplification stage with high gain for precision, and a second amplification stage for speed enhancement. This segmentation allows each stage to be optimized independently, resolving the contradiction between measurement precision and response speed by distributing these functions across separate circuit blocks.
Solution Approach 2:
The patent employs dynamic element sizing where transistor widths are optimized at different stages. The first amplification stage uses larger transistors for high gain, while the second stage uses smaller transistors for faster switching. This dynamic optimization of device dimensions across stages enables both high precision and fast response.
2Speed
If simplified comparator design is used, then speed is improved, but measurement precision deteriorates
Solution Approach 1:
The comparator architecture separates precision-critical functions from speed-critical functions into different stages. The first amplification stage handles precision requirements with high gain, while the second amplification stage handles speed requirements with optimized sizing, allowing the simplified overall structure to achieve both goals.
Solution Approach 2:
The patent changes key parameters such as transistor width and length across different stages. By adjusting these physical parameters dynamically across the circuit hierarchy, the design achieves high speed in the second stage while maintaining high precision in the first stage, resolving the contradiction between simplification and accuracy.
3Measurement precision
If multiple amplification stages are added, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent merges the offset cancellation function with the first amplification stage by using the same transistors for both purposes. This integration eliminates the need for separate offset cancellation circuits, reducing overall device complexity while maintaining the precision benefits of multiple amplification stages.
Solution Approach 2:
The first amplification stage serves multiple functions: it provides high gain for precision comparison and simultaneously performs offset cancellation. This multi-functionality reduces the total number of components needed, allowing multiple amplification stages to be implemented without proportionally increasing device complexity.
Data Source
AI summary
Embodiments of the present disclosure provide a comparator. The comparator includes a first current source circuit, a pre-amplifier circuit, an amplifier circuit, a comparison circuit, and an output circuit. The first current source circuit is configured to provide a first constant current to the pre-amplifier circuit. The pre-amplifier circuit is configured to amplify a first input signal into a first pre-amplified signal and amplify a second input signal into a second pre-amplified signal based on a first constant current. The amplifier circuit includes a current mirror and a load circuit. The load circuit comprises a differential diode-connected transistor. The comparison circuit is configured to compare the first amplified signal with the second amplified signal. The output circuit is configured to output a first voltage or a second voltage based on a result of the comparison.


