Comparator Offset Calibration Using Universal Code
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Solution Overview
Problem
High-speed and high-precision comparator modules in semiconductor components, such as power converters, require efficient calibration across multiple operating modes to maintain accurate voltage outputs, but existing calibration methods are time-consuming and resource-intensive, especially when multiple calibration codes are needed for different modes.
Innovation Solution
A calibration circuit and method that selects operation in multiple modes, generates bias currents, connects preamplifier inputs to receive a predetermined voltage, determines offset, and adjusts resistance to minimize voltage offsets, generating a single calibration code for use across all modes, thereby reducing calibration time and semiconductor area.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If multiple calibration codes are used for different modes, then calibration accuracy is improved, but calibration time and processing power increase
Solution Approach 1:
A single calibration code is designed to serve multiple operating modes (first mode and second mode) of the comparator. The calibration code generated during calibration of the first mode is reused for the second mode, eliminating the need for separate calibration codes for each mode. This universal approach maintains calibration accuracy across different modes while significantly reducing calibration time and processing requirements.
2Measurement precision
If multiple calibration codes are stored for different modes, then mode-specific calibration accuracy is improved, but semiconductor area increases
Solution Approach 1:
Instead of allocating separate storage space for multiple calibration codes corresponding to different operating modes, the invention implements a universal calibration code that functions across all modes. This single calibration code is stored in the calibration register and reused by the calibration logic for both the first mode and second mode, thereby minimizing the semiconductor area required for calibration data storage while maintaining adequate calibration accuracy.
3Measurement precision
If repeated calibration is performed for each mode, then calibration accuracy is improved, but processing power and time increase
Solution Approach 1:
The calibration process is performed preliminarily during the first mode to generate a calibration code that is then reused for the second mode. Instead of performing repeated calibration operations for each mode, the system conducts calibration once in advance (during first mode) and applies the resulting calibration code across all operating modes. This preliminary calibration action significantly reduces the processing power and time required while maintaining calibration accuracy across different modes.
Data Source
AI summary
A calibration circuit including mode, bias, calibration, offset, resistance and code modules. The mode module selects operation in a first or second mode. The bias module generates, for the preamplifier, a first and second bias currents respectively while in first and second modes. The calibration module, during calibration of first mode, connects inputs of preamplifier together to receive a predetermined voltage. The offset module determines an offset based on output voltages of preamplifier or output voltage of comparator and generates a control signal based on whether the offset is within a predetermined range. The resistance module, based on control signal and during calibration of first mode, adjusts a resistance of a resistor in a first resistance set of preamplifier for the first mode. The code module generates a calibration code based on the resistance. The resistance module calculates a second resistance set for second mode based on the calibration code.