Comparator Input-Swapping Self-Test for Fast Fault Detection
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Solution Overview
Problem
Analog comparators require a self-test function to ensure system safety, but their high response speed demands a short self-test time to avoid affecting normal system operations.
Innovation Solution
A comparator testing circuit comprising a switching circuit, a comparator, and a determination circuit, which exchanges the input signals of the comparator's two input terminals and determines if the output signal differs before and after the exchange, thereby identifying if the comparator is abnormal.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a self-test function is implemented in the analog comparator, then system safety and reliability are improved, but the self-test time increases which may affect normal system operations
Solution Approach 1:
The patent implements preliminary action by pre-configuring test signal paths and using a switching circuit to rapidly exchange input signals during self-test. The test signals are prepared in advance and the switching mechanism is pre-established, allowing the comparator to perform self-test without lengthy setup procedures, thus minimizing test time while ensuring comprehensive reliability checking
Solution Approach 2:
The patent applies the skipping principle by using a dedicated switching circuit that can rapidly exchange input signals in a controlled manner. The test process is streamlined to quickly switch between normal operation mode and self-test mode, rushing through the self-test procedure efficiently. The determination circuit immediately evaluates the exchanged signals and generates test results without delay, minimizing the time the comparator is taken out of normal operation
2Reliability
If the self-test function is added to ensure system safety, then the reliability is improved, but the system operation time is reduced due to testing interruptions
Solution Approach 1:
The patent implements periodic action by enabling the self-test function to be triggered at specific intervals or under predetermined conditions rather than continuously. The switching circuit can be controlled to perform signal exchange periodically, and the determination circuit evaluates results at these periodic intervals. This approach ensures system reliability through regular testing while maintaining high productivity by allowing uninterrupted operation during non-test periods
Solution Approach 2:
The patent applies self-service by designing the self-test function to be automatically triggered by internal conditions or external signals without requiring manual intervention. The switching circuit and determination circuit work autonomously to perform the test sequence and evaluate results, allowing the comparator to self-diagnose its functionality. This automated approach ensures reliability checking is performed consistently while minimizing impact on system productivity
Data Source
AI summary
A comparator testing circuit and a testing method are provided. The comparator testing circuit includes a switching circuit, a comparator, and a determination circuit. The switching circuit receives a first signal, a second signal, and a switching signal, and outputs one of the first signal and the second signal as a first input signal and the other of the first signal and the second signal as a second input signal according to the switching signal. The comparator compares the first input signal with the second input signal to generate an output signal. The determination circuit determines whether the comparator is abnormal based on the switching signal and the output signal to generate an exception flag.