Compliant Probes With Dual Spring Segments for Pointing Accuracy
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Solution Overview
Problem
Current electrical contact probes face challenges in achieving improved mechanical and electrical properties, reduced fabrication costs, and enhanced design versatility, particularly in miniature devices, where traditional methods struggle with precision and efficiency.
Innovation Solution
The development of compliant pin probes with multiple spring segments, including tensional and compression springs, and innovative assembly methods that allow for pre-biased configurations and enhanced stability, enabling precise contact and reduced lateral misalignment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If traditional probe designs are used, then fabrication is simpler, but mechanical and electrical properties are inferior and pointing accuracy is reduced
Solution Approach 1:
The probe is divided into multiple functional segments including a rigid body portion, a compliant portion with spring segments, and contact elements. This segmentation allows each portion to be optimized independently - the rigid body provides structural support while the compliant portion with spring segments delivers precise contact force and positioning, thereby improving pointing accuracy without requiring the entire probe structure to be complex
Solution Approach 2:
The probe employs composite construction combining rigid materials for the body portion and elastic materials for the spring segments and compliant portions. This composite approach enables the probe to simultaneously achieve structural stability from the rigid portions and precise, stable contact from the elastic portions, resolving the contradiction between simplicity and performance
2Stability of the object's composition
If multiple spring segments are used, then stability and pointing accuracy are improved, but fabrication complexity increases
Solution Approach 1:
The compliant portion is segmented into multiple spring segments that can be independently formed and then assembled. This segmentation allows each spring segment to be fabricated using standard techniques and then combined through modular assembly, maintaining fabrication ease while achieving the stability benefits of multiple springs
Solution Approach 2:
The spring segments are pre-formed as separate components with predetermined elastic properties before final assembly. This preliminary action allows for precise control of each spring's characteristics using conventional fabrication methods, and the pre-formed segments are then easily assembled into the final probe structure, achieving stability without proportionally increasing fabrication complexity
3Measurement precision
If pre-biased configurations are implemented, then contact precision is enhanced, but device complexity increases
Solution Approach 1:
The probe incorporates a dynamic pre-bias mechanism where the spring segments are configured to automatically exert a predetermined contact force against the contact element. This dynamic configuration allows the probe to maintain precise contact through elastic deformation of the springs rather than through complex mechanical pre-positioning systems, enhancing contact precision while keeping the overall configuration relatively simple
Solution Approach 2:
The spring segments serve a dual function: they provide structural compliance and simultaneously generate the pre-bias contact force through their elastic properties. This self-service approach eliminates the need for separate pre-biasing mechanisms, achieving enhanced contact precision without proportionally increasing device complexity
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
These probes provide improved pointing accuracy and stability, reduced fabrication costs, and increased design flexibility, enabling effective electrical connections in miniature devices with enhanced mechanical and electrical performance.
Implementation Method 1
Probe contact elements with spring segments and methods for making and using the same. The probes include relatively movable rigid elements with operational gaps that are smaller than can be generally formed in an assembled state or that have varying gap widths that provide for effective formation as well as stabilized probe operation
Data Source
AI summary
Probe structures, arrays, methods of using probes and arrays, and/or methods for making probes and/or arrays wherein the probes include at least one flat tensional spring segments and in some embodiments include one or both of:(1) narrowed channel passage segments (e.g. by increasing width of plunger elements or by decreasing channel widths) along portions of channel lengths (e.g. not entire channel lengths) to enhance stability or pointing accuracy while still allowing for assembled formation of movable probe elements and/or (2) pairs of joined probes with at least one end of the probe set having independently compressible tips (e.g. as Kelvin probe pairs for use in 4 wire Kelvin probe tests).