Electronic Component Suitability Determination via Reference Plane

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Solution Overview

Problem

Existing component inspection devices fail to accurately determine the suitability of electronic components for mounting on a circuit board, as they do not adequately consider the positional relationship between electrodes and contact sections, which can lead to improper mounting despite normal electrode flatness.

Innovation Solution

A component determination device and method that measure the positions of reference points on a reference section and electrodes, calculate a reference plane representing the circuit board's surface, and determine suitability based on the distance between this plane and the electrodes, ensuring accurate assessment of the component's position and posture.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If only electrode flatness is inspected, then the inspection process is simple, but the determination accuracy of component suitability is insufficient

Engineering Contradiction:
Improvedetermination accuracyVSAvoidinspection complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The inspection process is segmented into distinct functional modules: a measuring device for collecting position data, a plane calculating section for computing the reference plane from contact section positions, and a suitability determining section for evaluating electrode positions relative to the reference plane. This segmentation allows complex multi-parameter inspection to be performed systematically without overwhelming system complexity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

A reference plane is introduced as an intermediary computational construct that mediates between the measured positions of contact sections and the evaluation of electrode suitability. The reference plane serves as a virtual reference surface that accounts for the actual mounting posture, enabling accurate suitability determination without requiring direct physical measurement of the mounting surface.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Measurement precision

If the positional relationship between electrodes and contact section is considered, then the suitability determination accuracy is improved, but the measurement complexity increases

Engineering Contradiction:
Improvesuitability determination accuracyVSAvoidmeasurement difficulty
Core Design Contradiction:
Measurement precisionVSDifficulty of detecting and measuring

Solution Approach 1:

The measuring device performs multiple functions: it measures both the positions of contact sections (to establish the reference plane) and the positions of electrodes (to evaluate suitability). This multi-functionality reduces the need for separate measurement systems and simplifies the overall measurement process while achieving comprehensive inspection.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The reference plane is calculated in advance based on the measured positions of contact sections before the suitability evaluation of electrodes is performed. This preliminary action establishes a customized reference framework that accounts for the specific mounting posture of each component, simplifying the subsequent suitability determination process.

Inventive Principle:
Principle #10Preliminary action

3Productivity

If a fixed reference plane is used for all components, then the inspection process is simplified, but the accuracy for components with contact sections is reduced

Engineering Contradiction:
Improveinspection efficiencyVSAvoidsuitability determination accuracy
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

The reference plane transitions from a fixed, predetermined surface to a dynamic, component-specific plane that is recalculated for each electronic component based on its actual contact section positions. This dynamic adaptation allows the inspection system to efficiently accommodate variations in component mounting posture while maintaining high determination accuracy.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The parameters defining the reference plane (position and orientation) are changed for each component based on measured data from its contact sections. Instead of using a universal fixed reference plane, the system adjusts the reference plane parameters to match each component's specific mounting characteristics, thereby maintaining both efficiency and accuracy.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentEP3419404B1Component determination device and component determination method
Publication Date: 2021.05.19 FUJI CORP
  • EP3419404B1 patent drawingFigure 1~2
  • EP3419404B1 patent drawingFigure 3A~3B
  • EP3419404B1 patent drawingFigure 3C~4

AI summary

A component determination device and a component determination method that improve the accuracy of determining whether an electronic component is good or not in accordance with the type of electronic component. The electronic component for which the component determination device determines suitability includes a reference section that is formed as a different member to the multiple electrodes and that contacts an upper surface of the circuit board when the electronic component is mounted on the circuit board. The component determination device includes: a measuring device configured to measure positions of multiple reference points set on the reference section and a position of a measurement point set on each of the multiple electrodes; a plane calculating section configured to calculate a reference plane representing a position of the upper surface of the circuit board with respect to the component main body when the electronic component is mounted on the circuit board based on the positions of the multiple reference points; and a suitability determining section configured to determine whether the electronic component is suitable based on a distance between the reference plane and the multiple measurement points.