Integrated Component Testing Voltage Range Optimization
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Solution Overview
Problem
Current component testing methods are inefficient and unreliable, as they fail to accurately screen components for voltage tolerance variations, leading to potential device failures and uncertainty for users, especially when components with low margins pass initial tests but later degrade, and users are unsure if the device is correctly configured for added components.
Innovation Solution
An integrated component testing system and method that modifies a reference voltage to determine a voltage range and sets a reference voltage value within that range, using a voltage module, test module, and optimization module integrated within the electronic device to test components at various voltage levels and ensure they operate within safe parameters.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If traditional component testing methods are used, then components can be screened with standard equipment, but components with low voltage margins may pass the test and later fail in the field
Solution Approach 1:
The patent applies parameter changes by systematically varying the reference voltage to multiple different voltage values during the testing process. This allows the test to detect components with low voltage margins that would pass standard single-voltage testing, thereby improving both reliability and measurement precision simultaneously.
Solution Approach 2:
The patent implements preliminary action by performing comprehensive voltage-range testing on components before they are installed in the electronic device. This preliminary multi-voltage screening identifies components with low voltage margins early, preventing future field failures and ensuring only components with adequate voltage tolerance are deployed.
2Measurement precision
If specialized external testing equipment and personnel are used to screen components, then testing accuracy improves, but testing cost and complexity increase
Solution Approach 1:
The patent applies self-service by enabling the electronic device to test its own components using internally available voltage regulation circuitry and processing units. This eliminates the need for specialized external testing equipment and personnel, achieving high testing accuracy while reducing complexity and cost.
Solution Approach 2:
The patent implements universality by designing the testing system to use existing multi-functional components within the electronic device, such as the voltage regulation circuitry and processor, for both normal operation and component testing. This approach achieves accurate component screening without requiring dedicated specialized testing equipment.
3Reliability
If components are tested only after being added to the electronic device, then the testing reflects actual operating conditions, but the variability of the electronic device cannot be accounted for during manufacturing
Solution Approach 1:
The patent applies preliminary action by performing component testing during the manufacturing process, before components are installed in the electronic device. This early testing identifies defective components with low voltage margins, allowing them to be replaced before assembly, thereby predicting and preventing future field failures without delaying the overall process.
4Productivity
If a single reference voltage is used for component testing, then the testing process is simple and fast, but components with different optimal voltage requirements cannot be properly evaluated
Solution Approach 1:
The patent applies parameter changes by systematically varying the reference voltage to multiple different voltage values during the testing process. This allows accurate determination of each component's voltage range and optimal operating voltage, enabling proper evaluation of components with different voltage requirements while maintaining efficient automated testing.
Data Source
AI summary
An apparatus, system, and method are disclosed for integrating component testing. A voltage module modifies a reference voltage integral to an electronic device to a plurality of reference voltage values. A test module tests a component of the electronic device at each of the plurality of reference voltage values. In addition, the test module determines a voltage range for the component, wherein the voltage range comprises voltage values between a high voltage failure and a low voltage failure. An optimization module sets the reference voltage value to within the voltage range.