Composite Electret Layer for High-Temperature Thin-Film Stability

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Solution Overview

Problem

Existing electret materials face challenges in high temperature stability and thin-film formation, leading to performance deterioration and substrate damage due to high processing temperatures, making them unsuitable for miniaturized devices and high-temperature applications.

Innovation Solution

A composite metal electret layer with a bandgap energy of 4 eV or more, formed using an inorganic dielectric material with two or more metal elements, is subjected to polarization treatment, allowing for high surface potential retention and reduced thermal damage, enabling stable performance in high-temperature environments without requiring processing temperatures above 1000°C.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If existing electret materials are used, then electret function is achieved, but high temperature stability deteriorates and performance deteriorates over time

Engineering Contradiction:
Improvehigh temperature stabilityVSAvoidperformance stability
Core Design Contradiction:
ReliabilityVSStability of the object's composition

Solution Approach 1:

The patent uses a composite structure consisting of an inorganic dielectric material layer and an organic electret material layer. The inorganic layer provides high temperature stability and structural support, while the organic layer provides electret functionality. This composite approach resolves the contradiction by combining materials with complementary properties to achieve both reliability and compositional stability.

Inventive Principle:
Principle #40Composite materials

Solution Approach 2:

The patent specifies that the inorganic dielectric material should have a bandgap energy of 4 eV or more, which is a critical parameter change. This high bandgap energy parameter ensures that the material maintains its electrical properties at high temperatures, thereby improving high temperature stability while maintaining performance consistency over time.

Inventive Principle:
Principle #35Parameter changes

2Volume of moving object

If thin film formation is attempted with existing materials, then miniaturization is enabled, but substrate damage occurs due to high processing temperatures

Engineering Contradiction:
Improvedevice sizeVSAvoidsubstrate damage
Core Design Contradiction:
Volume of moving objectVSObject-affected harmful factors

Solution Approach 1:

The patent changes the processing temperature parameter by using materials that can be deposited at low temperatures. The inorganic dielectric material with bandgap ≥4 eV can be formed using sputtering or atomic layer deposition at temperatures below 400°C, preventing substrate damage while enabling thin film formation for miniaturized devices.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent applies different material properties to different layers: the inorganic dielectric layer provides thermal stability and can be processed at low temperatures, while the organic electret layer provides the necessary electret properties. This local differentiation of material qualities allows miniaturization through thin films without substrate damage.

Inventive Principle:
Principle #3Local quality

3Ease of manufacture

If high processing temperatures are used, then electret material formation is achieved, but substrate wiring damage occurs

Engineering Contradiction:
Improveelectret material formationVSAvoidwiring damage
Core Design Contradiction:
Ease of manufactureVSObject-affected harmful factors

Solution Approach 1:

The patent changes the processing temperature parameter from high temperature (>1000°C) to low temperature (<400°C) by selecting appropriate materials. The inorganic dielectric material with high bandgap energy can be formed at low temperatures using modern deposition techniques, and the organic electret material is then deposited at even lower temperatures, preventing wiring damage while achieving electret material formation.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The composite structure allows each layer to be optimized for its specific processing requirements. The inorganic layer provides a stable base formed at low temperature, protecting the substrate wiring, while the organic layer provides electret functionality. This composite approach enables ease of manufacture without wiring damage.

Inventive Principle:
Principle #40Composite materials

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution provides a stable and high-surface-potential electret layer that can be applied to devices without peeling off or damaging substrate wiring, ensuring reliable performance in both high-temperature and long-term use.

Implementation Method 1

an electret layer formed above a surface of the substrate. The electret layer is a composite metal compound containing two or more different metal elements and is obtained by subjecting a thin film mainly composed of an inorganic dielectric material having a bandgap energy of 4 eV or more to a polarization treatment

Methodology Applied
Scientific EffectPolarization: Polarisation

Data Source

PatentUS11917919B2Electret
Publication Date: 2024.02.27 DENSO CORP
  • US11917919B2 patent drawing
  • US11917919B2 patent drawing
  • US11917919B2 patent drawing

AI summary

An electret includes a substrate and an electret layer formed above a surface of the substrate. The electret layer is a composite metal compound containing two or more different metal elements, and is obtained by subjecting a thin film mainly composed of an inorganic dielectric material having a bandgap energy of 4 eV or more to a polarization treatment.