Composite Sample Imaging With Low-Intensity Overlap Illumination

Resolve Bottlenecks,
Find Innovative SolutionsGenerate Solutions

Solution Overview

Problem

Stitching artifacts in composite images, such as ghost or double images, are caused by optical or mechanical tolerances, and correcting these artifacts in post-processing alters pixel intensities, making quantitative analysis impossible, while multiple exposure to illumination leads to sample bleaching and grid patterns.

Innovation Solution

A device and method that control illumination intensity, ensuring overlap regions are illuminated with lower intensity than non-overlap regions, using structured illumination and controlled light modulation to prevent bleaching and stitching artifacts.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Area of stationary object

If multiple individual images are captured to create a composite image, then the field of view is expanded, but stitching artifacts such as ghost or double images occur in overlap regions

Engineering Contradiction:

Improvefield of viewVSAvoidstitching precision

Core Design Contradiction:

Area of stationary objectVSManufacturing precision

Solution Approach 1:

The patent applies local quality by differentiating the treatment of overlap regions from non-overlap regions. The control unit identifies overlap regions and applies different image processing operations to them compared to non-overlap regions, thereby locally optimizing image quality at seams while maintaining overall composite image integrity.

Inventive Principle:

Principle #3Local quality

Solution Approach 2:

The patent performs preliminary action by pre-identifying overlap regions before final composite image assembly. The control unit determines which regions are overlap regions in advance and prepares appropriate processing strategies for these regions to prevent stitching artifacts before they manifest in the final composite image.

Inventive Principle:

Principle #10Preliminary action

2Manufacturing precision

If pixel intensities in overlap regions differ from non-overlap regions, then stitching artifacts occur, but post-processing correction alters pixel intensities and prevents quantitative analysis

Engineering Contradiction:

Improvestitching precisionVSAvoidquantitative analysis accuracy

Core Design Contradiction:

Manufacturing precisionVSMeasurement precision

Solution Approach 1:

The patent performs preliminary action by pre-identifying and flagging overlap regions before final composite image assembly. This allows the system to apply appropriate processing strategies to prevent intensity mismatches before they create artifacts, while preserving the original pixel intensity values for quantitative analysis.

Inventive Principle:

Principle #10Preliminary action

Solution Approach 2:

Inventive Principle:

Principle #3Local quality

3Reliability

If overlap regions are illuminated with standard intensity, then sufficient signal is obtained, but multiple exposure leads to increased sample bleaching and grid patterns

Engineering Contradiction:

Improvesignal qualityVSAvoidsample bleaching

Core Design Contradiction:

ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The patent applies local quality by differentiating illumination intensity between overlap regions and non-overlap regions. The control unit identifies overlap regions and reduces illumination intensity specifically in these regions during image capture, thereby locally reducing cumulative light exposure and sample bleaching while maintaining sufficient signal quality in non-overlap regions.

Inventive Principle:

Principle #3Local quality

Data Source

PatentUS12513386B2Method and device for generating a composite image of a sample

Publication Date: 2025.12.30 LEICA MICROSYSTEMS CMS GMBH

AI summary

A device for generating a composite image of a sample includes an illumination unit configured to generate illumination light for illuminating the sample, and an image capture unit configured to generate a first individual image of the sample and a second individual image of the sample. The first individual image corresponds to a first sample region. The second individual image corresponds to a second sample region that is different from the first sample region and overlaps with the first sample region in an overlap region. The device further includes a control unit configured to control the illumination unit in such a way that, when generating each of the first individual image and the second individual image, at least the overlap region is illuminated with a lower intensity of the illumination light than a remaining portion of the first sample region and a remaining portion of the second sample region.